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name:-0.017237901687622
name:-0.013859033584595
name:-0.0015230178833008
Lee; Wan Seob Patent Filings

Lee; Wan Seob

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lee; Wan Seob.The latest application filed is for "storage device and operating method thereof".

Company Profile
1.15.13
  • Lee; Wan Seob - Icheon-si KR
  • LEE; Wan Seob - Icheon-si Gyeonggi-do KR
  • Lee; Wan Seob - Gyeonggi-do KR
  • Lee; Wan Seob - Icheon KR
  • Lee; Wan Seob - Gangwon-do N/A KR
  • Lee; Wan Seob - Chuncheon-si Gangwon-do KR
  • LEE; Wan Seob - Chuncheon-si KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Address counting circuit and semiconductor device including the address counting circuit
Grant 11,373,711 - Lee June 28, 2
2022-06-28
Storage Device And Operating Method Thereof
App 20220066671 - LEE; Wan Seob
2022-03-03
Address Counting Circuit And Semiconductor Device Including The Address Counting Circuit
App 20210335430 - LEE; Wan Seob
2021-10-28
Semiconductor memory device
Grant 11,017,844 - Lee May 25, 2
2021-05-25
Semiconductor Memory Device
App 20200372947 - LEE; Wan Seob
2020-11-26
Memory device and operating method thereof
Grant 10,726,935 - Lee
2020-07-28
Memory Device And Operating Method Thereof
App 20200082899 - LEE; Wan Seob
2020-03-12
Semiconductor memory device performing randomization operation
Grant 10,361,722 - Lee
2019-07-23
Semiconductor Memory Device Performing Randomization Operation
App 20180131390 - LEE; Wan Seob
2018-05-10
Latch circuit, receiver circuit, semiconductor apparatus and system using the latch and receiver circuits
Grant 9,628,056 - Lee April 18, 2
2017-04-18
Semiconductor test device
Grant 9,373,420 - Lee June 21, 2
2016-06-21
Memory system and method of operating the same
Grant 9,318,198 - Jung , et al. April 19, 2
2016-04-19
Semiconductor Test Device
App 20160042808 - LEE; Wan Seob
2016-02-11
Semiconductor test device
Grant 9,196,382 - Lee November 24, 2
2015-11-24
Semiconductor memory device
Grant 9,152,326 - Lee , et al. October 6, 2
2015-10-06
Semiconductor Test Device
App 20150213907 - LEE; Wan Seob
2015-07-30
Semiconductor memory device, reading method thereof, and data storage device having the same
Grant 8,705,276 - Lee April 22, 2
2014-04-22
Semiconductor Memory Device
App 20140108725 - LEE; Wan Seob ;   et al.
2014-04-17
Semiconductor memory device and method of operation the same
Grant 8,625,376 - Jung , et al. January 7, 2
2014-01-07
Semiconductor Memory Device, Reading Method Thereof, And Data Storage Device Having The Same
App 20130135928 - LEE; Wan Seob
2013-05-30
Semiconductor Memory Device And Method Of Operation The Same
App 20120281488 - Jung; Min Joong ;   et al.
2012-11-08
Memory System And Method Of Operating The Same
App 20120151161 - JUNG; Min Joong ;   et al.
2012-06-14
Test method for nonvolatile memory device
Grant 8,120,977 - Lee , et al. February 21, 2
2012-02-21
Test Method For Nonvolatile Memory Device
App 20090287972 - LEE; Wan Seob ;   et al.
2009-11-19

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