Lee; Sangkil

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lee; Sangkil.The latest application filed is for "semiconductor package".

Company Profile

5.11.15

Lee; Sangkil - Suwon-si KR
LEE; Sangkil - Seongnam-si KR
Lee; Sangkil - Yongin-si KR
Lee; Sangkil - Seoul N/A KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor Package App 20220139875 - Lee; Sangkil ; et al.	2022-05-05
Semiconductor package Grant 11,251,155 - Lee , et al. February 15, 2	2022-02-15
Memory Device App 20210280230 - CHO; Minhee ; et al.	2021-09-09
Memory device Grant 11,062,751 - Cho , et al. July 13, 2	2021-07-13
Memory Device App 20200388313 - CHO; Minhee ; et al.	2020-12-10
Semiconductor Package App 20200381393 - LEE; Sangkil ; et al.	2020-12-03
Mass flow controller, apparatus for manufacturing semiconductor device, and method for maintenance thereof Grant 10,845,232 - Lee , et al. November 24, 2	2020-11-24
Fusion Memory Device And Method Of Fabricating The Same App 20200203328 - Park; Hyunmog ; et al.	2020-06-25
Mass Flow Controller, Apparatus For Manufacturing Semiconductor Device, And Method For Maintenance Thereof App 20190170563 - Lee; Sangkil ; et al.	2019-06-06
Methods Of Inspecting Substrates And Semiconductor Fabrication Methods Incorporating The Same App 20170200658 - Yang; Yusin ; et al.	2017-07-13
Block assembly Grant 9,579,589 - Lee , et al. February 28, 2	2017-02-28
Method of manufacturing a semiconductor device using semiconductor measurement system Grant 9,583,402 - Ryu , et al. February 28, 2	2017-02-28
Block Assembly App 20170036137 - LEE; SANGKIL ; et al.	2017-02-09
Method of inspecting semiconductor device and method of fabricating semiconductor device using the same Grant 9,466,537 - Kim , et al. October 11, 2	2016-10-11
Semiconductor inspection system and methods of inspecting a semiconductor device using the same Grant 9,455,121 - Kim , et al. September 27, 2	2016-09-27
Method Of Inspecting Semiconductor Device And Method Of Fabricating Semiconductor Device Using The Same App 20160204041 - KIM; Minkook ; et al.	2016-07-14
Semiconductor Inspection System And Methods Of Inspecting A Semiconductor Device Using The Same App 20160086769 - KIM; Hyunwoo ; et al.	2016-03-24
Methods and apparatuses for inspecting semiconductor devices using electron beams Grant 9,267,903 - Park , et al. February 23, 2	2016-02-23
Method Of Manufacturing A Semiconductor Device Using Semiconductor Measurement System App 20160027707 - RYU; Sung Yoon ; et al.	2016-01-28
Methods And Apparatuses For Inspecting Semiconductor Devices Using Electron Beams App 20140061462 - PARK; Mira ; et al.	2014-03-06

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