| Patent | Date |
|---|
Image Sensor And Image Sensing Device
App 20220139991 - KIM; Dae Shik ; et al. | 2022-05-05 |
Image Sensor
App 20220130884 - KIM; Dae Shik ; et al. | 2022-04-28 |
Semiconductor device
Grant 11,227,647 - Lee January 18, 2 | 2022-01-18 |
Semiconductor Device
App 20210098043 - LEE; Sang Kil | 2021-04-01 |
Semiconductor device
Grant 10,878,873 - Lee December 29, 2 | 2020-12-29 |
Memory Device Including Arithmetic Circuit And Neural Network System Including The Same
App 20200160157 - KIM; CHAN-KYUNG ; et al. | 2020-05-21 |
Memory Device Including A Random Input And Output Engine And A Storage Device Including The Memory Device
App 20200150894 - LEE; SANG-KIL ; et al. | 2020-05-14 |
Semiconductor Device
App 20200126606 - LEE; Sang Kil | 2020-04-23 |
Cryocooled SQUID measurement apparatus
Grant 10,613,160 - Yu , et al. | 2020-04-07 |
Squid sensor module and magnetoencephalography measuring apparatus
Grant 10,585,151 - Yu , et al. | 2020-03-10 |
Magnetoencephalography measuring apparatus
Grant 10,426,363 - Yu , et al. October 1, 2 | 2019-10-01 |
Method of inspecting wafer using electron beam
Grant 10,373,796 - Kim , et al. | 2019-08-06 |
Neutron Shielding Packing Body For Air Transportation Of Semiconductor Device
App 20190221525 - LEE; Kun Young ; et al. | 2019-07-18 |
Monitoring Apparatus And Semiconductor Manufacturing Apparatus Including The Same
App 20190139796 - LEE; Sang-kil ; et al. | 2019-05-09 |
Apparatus and method for exchanging probe
Grant 10,222,414 - Hong , et al. | 2019-03-05 |
Surface inspecting method
Grant 10,001,444 - Ko , et al. June 19, 2 | 2018-06-19 |
Mobile electronic device including embedded memory
Grant 9,946,466 - Lee April 17, 2 | 2018-04-17 |
Scanning electron microscope system capable of measuring in-cell overlay offset using high-energy electron beam and method thereof
Grant 9,934,939 - Kim , et al. April 3, 2 | 2018-04-03 |
Optical transformation module and optical measurement system, and method of manufacturing a semiconductor device using optical transformation module and optical measurement system
Grant 9,897,552 - Kim , et al. February 20, 2 | 2018-02-20 |
Apparatus for forming a thin layer and method of forming a thin layer on a substrate using the same
Grant 9,892,983 - Kim , et al. February 13, 2 | 2018-02-13 |
Low-temperature cooling apparatus and superconducting quantum interference device sensor module
Grant 9,829,546 - Yu , et al. November 28, 2 | 2017-11-28 |
Broadband light source and optical inspector having the same
Grant 9,831,626 - Ryu , et al. November 28, 2 | 2017-11-28 |
Apparatus and method for indirectly cooling superconducting quantum interference device
Grant 9,823,312 - Yu , et al. November 21, 2 | 2017-11-21 |
Td Probe And Its Uses
App 20170260576 - Chun; Jong Yoon ; et al. | 2017-09-14 |
Spectral ellipsometry measurement and data analysis device and related systems and methods
Grant 9,733,178 - Ryu , et al. August 15, 2 | 2017-08-15 |
Cryocooled Squid Measurement Apparatus
App 20170168121 - YU; Kwon-Kyu ; et al. | 2017-06-15 |
Apparatus and method for inspection of substrate defect
Grant 9,678,020 - Song , et al. June 13, 2 | 2017-06-13 |
Apparatus And Method For Exchanging Probe
App 20170160341 - HONG; JAE WAN ; et al. | 2017-06-08 |
Image creating method and imaging system for performing the same
Grant 9,659,743 - Kim , et al. May 23, 2 | 2017-05-23 |
Method of Inspecting Wafer Using Electron Beam
App 20160293379 - Kim; Souk ; et al. | 2016-10-06 |
Overlay measuring method and system, and method of manufacturing semiconductor device using the same
Grant 9,455,206 - Yun , et al. September 27, 2 | 2016-09-27 |
Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film
Grant 9,417,055 - Ryu , et al. August 16, 2 | 2016-08-16 |
Squid Sensor Module And Magnetoencephalography Measuring Apparatus
App 20160223622 - Yu; Kwon-Kyu ; et al. | 2016-08-04 |
Method And System For Detecting Defects
App 20160189369 - JUNG; Jae-Ouk ; et al. | 2016-06-30 |
Apparatus For Forming A Thin Layer And Method Of Forming A Thin Layer On A Substrate Usnig The Same
App 20160181167 - KIM; Min-Kook ; et al. | 2016-06-23 |
Image Creating Method And Imaging System For Performing The Same
App 20160181061 - KIM; Jung-Hwan ; et al. | 2016-06-23 |
Magnetoencephalography Measuring Apparatus And Magnetoencephalography Measuring Method
App 20160174862 - Yu; Kwon-Kyu ; et al. | 2016-06-23 |
Surface Inspecting Method
App 20160153915 - Ko; Kang-woong ; et al. | 2016-06-02 |
Block studying tool for infant
Grant 9,333,438 - Lee , et al. May 10, 2 | 2016-05-10 |
Hybrid Memory Module Structure And Method Of Driving The Same
App 20160110102 - LEE; Sang-Kil | 2016-04-21 |
Broadband Light Source And Optical Inspector Having The Same
App 20160097513 - RYU; Sung-Yoon ; et al. | 2016-04-07 |
Apparatus Of Inspecting Resistive Defects Of Semiconductor Devices And Inspecting Method Using The Same
App 20160084901 - PARK; Mi-Ra ; et al. | 2016-03-24 |
Apparatus For Measuring Thickness Of Thin Film, System Including The Apparatus, And Method For Measuring Thickness Of Thin Film
App 20160061583 - RYU; Sung-Yoon ; et al. | 2016-03-03 |
Mobile Electronic Device Including Embedded Memory
App 20160054917 - LEE; Sang-Kil | 2016-02-25 |
Conductive atomic force microscope and method of operating the same
Grant 9,261,532 - Kim , et al. February 16, 2 | 2016-02-16 |
Conductive Atomic Force Microscope And Method Of Operating The Same
App 20160033550 - KIM; Hyun-woo ; et al. | 2016-02-04 |
Apparatus And Method For Inspection Of Substrate Defect
App 20160025654 - SONG; Joon-Seo ; et al. | 2016-01-28 |
Spectral Ellipsometry Measurement and Data Analysis Device and Related Systems and Methods
App 20160025618 - Ryu; Sung-Yoon ; et al. | 2016-01-28 |
Optical Transformation Module And Optical Measurement System, And Method Of Manufacturing A Semiconductor Device Using Optical Transformation Module And Optical Measurement System
App 20160018328 - Kim; Tae-Joong ; et al. | 2016-01-21 |
Overlay Measuring Method And System, And Method Of Manufacturing Semiconductor Device Using The Same
App 20160013109 - YUN; Seong-Jin ; et al. | 2016-01-14 |
Block Studying Tool For Infant
App 20150343320 - LEE; Sang Kil ; et al. | 2015-12-03 |
Display device
Grant 9,196,182 - Baek , et al. November 24, 2 | 2015-11-24 |
Method of detecting a defect of a substrate and apparatus for performing the same
Grant 9,194,816 - Rim , et al. November 24, 2 | 2015-11-24 |
Stable liquid compositions for treating stomatitis comprising epidermal growth factor
Grant 9,155,697 - Kim , et al. October 13, 2 | 2015-10-13 |
Apparatus And Method For Indirectly Cooling Superconducting Quantum Interference Device
App 20150268311 - Yu; Kwon-Kyu ; et al. | 2015-09-24 |
Process Management Systems Using Comparison Of Statistical Data To Process Parameters And Process Management Devices
App 20150248127 - Yang; Yu Sin ; et al. | 2015-09-03 |
Methods of fabricating microelectronic substrate inspection equipment
Grant 9,123,503 - Kim , et al. September 1, 2 | 2015-09-01 |
Low-temperature Cooling Apparatus And Superconducting Quantum Interference Device Sensor Module
App 20150226813 - Yu; Kwon-Kyu ; et al. | 2015-08-13 |
Method of inspecting wafer
Grant 9,036,895 - Sohn , et al. May 19, 2 | 2015-05-19 |
Scanning Electron Microscope System Capable Of Measuring In-cell Overlay Offset Using High-energy Electron Beam And Method Thereof
App 20150115154 - Kim; Min Kook ; et al. | 2015-04-30 |
Method of Detecting a Defect of a Substrate and Apparatus for Performing the Same
App 20150070690 - Rim; Min-Ho ; et al. | 2015-03-12 |
Side curtain airbag and airbag system comprising the same
Grant 8,960,714 - Kim , et al. February 24, 2 | 2015-02-24 |
Defect inspection apparatus and defect inspection method using the same
Grant 8,902,412 - Sohn , et al. December 2, 2 | 2014-12-02 |
Broadband light illuminators
Grant 8,841,824 - Ko , et al. September 23, 2 | 2014-09-23 |
Polyester fabrics for airbag and preparation method thereof
Grant 8,822,358 - Kim , et al. September 2, 2 | 2014-09-02 |
Methods Of Fabricating Microelectronic Substrate Inspection Equipment
App 20140224987 - KIM; Min-Kook ; et al. | 2014-08-14 |
Method and apparatus to measure step height of device using scanning electron microscope
Grant 8,759,763 - Sohn , et al. June 24, 2 | 2014-06-24 |
Multi-chip Package And Manufacturing Method Thereof
App 20140145331 - HWANG; DOO-HEE ; et al. | 2014-05-29 |
Microelectronic substrate inspection equipment using helium ion microscopy
Grant 8,729,468 - Kim , et al. May 20, 2 | 2014-05-20 |
Methods of generating three-dimensional process window qualification
Grant 8,703,405 - Sohn , et al. April 22, 2 | 2014-04-22 |
Nanoliposome using esterified lecithin and method for preparing the same, and composition for preventing or treating skin diseases comprising the same
Grant 8,685,440 - Hong , et al. April 1, 2 | 2014-04-01 |
Display Device
App 20140063023 - BAEK; Kwang Hyun ; et al. | 2014-03-06 |
Method Of Inspecting Wafer
App 20130301903 - SOHN; Young-hoon ; et al. | 2013-11-14 |
Side Curtain Airbag And Airbag System Comprising The Same
App 20130280444 - KIM; Jae-Hyung ; et al. | 2013-10-24 |
Method And Apparatus To Measure Step Height Of Device Using Scanning Electron Microscope
App 20130234021 - Sohn; Young-Hoon ; et al. | 2013-09-12 |
Microelectronic Substrate Inspection Equipment Using Helium Ion Microscopy
App 20130175445 - Kim; Min-Kook ; et al. | 2013-07-11 |
Broadband Light Illuminators
App 20130169140 - KO; Woo-Seok ; et al. | 2013-07-04 |
Stable liquid formulation of human growth hormone
Grant 8,409,586 - Kim , et al. April 2, 2 | 2013-04-02 |
Methods Of Generating Three-dimensional Process Window Qualification
App 20120315583 - Sohn; Young-Hoon ; et al. | 2012-12-13 |
Defect Inspection Apparatus And Defect Inspection Method Using The Same
App 20120314205 - SOHN; Young-Hoon ; et al. | 2012-12-13 |
Td Probe And Its Uses
App 20120220468 - Chun; Jong Yoon ; et al. | 2012-08-30 |
Light source unit, manufacturing method thereof, and display device having the same
Grant 8,152,354 - Hong , et al. April 10, 2 | 2012-04-10 |
Polyester Fabrics For Airbag And Preparation Method Thereof
App 20120043742 - Kim; Jae-Hyung ; et al. | 2012-02-23 |
Methods, systems and computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles
Grant 7,923,684 - Kang , et al. April 12, 2 | 2011-04-12 |
Side Curtain Airbag And Airbag System Comprising The Same
App 20110012331 - Kim; Jae-Hyung ; et al. | 2011-01-20 |
Inflatable Fabrics And An Air-bag
App 20100253047 - Youn; Jung-Hoon ; et al. | 2010-10-07 |
System And Method For Monitoring Vibration Of Power Transformer
App 20100102976 - Lee; Wook Ryun ; et al. | 2010-04-29 |
Semiconductor memory device having single-level cells and multi-level cells and method of driving the semiconductor memory device
Grant 7,698,615 - Kang , et al. April 13, 2 | 2010-04-13 |
Stable Liquid Compositions For Treating Stomatitis Comprising Epidermal Growth Factor
App 20100035809 - Kim; Sun-Hee ; et al. | 2010-02-11 |
Stable Liquid Formulation Of Human Growth Hormone
App 20090298768 - Kim; Sun hee ; et al. | 2009-12-03 |
Nanoliposome Using Esterified Lecithin And Method For Preparing The Same, And Composition For Preventing Or Treating Skin Diseases Comprising The Same
App 20090263473 - Hong; Joon Pio ; et al. | 2009-10-22 |
Light Source Unit, Manufacturing Method Thereof, And Display Device Having The Same
App 20090185362 - HONG; Ki-Hyun ; et al. | 2009-07-23 |
Integrated control system for vehicles
App 20090093933 - Kim; Jong Dae ; et al. | 2009-04-09 |
Methods, Systems and Computer Program Products for Measuring Critical Dimensions of Fine Patterns Using Scanning Electron Microscope Pictures and Secondary Electron Signal Profiles
App 20090077696 - Kang; Min-Sub ; et al. | 2009-03-19 |
Sustained Release Film Formulation For Healing Wound Comprising Epidermal Growth Factor
App 20090047331 - Kim; Sun Hee ; et al. | 2009-02-19 |
Computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles
Grant 7,468,512 - Kang , et al. December 23, 2 | 2008-12-23 |
Method and apparatus for classifying defects of an object
Grant 7,405,817 - Hyun , et al. July 29, 2 | 2008-07-29 |
Semiconductor memory device having single-level cells and multi-level cells and method of driving the semiconductor memory device
App 20080141100 - Kang; Eun-suk ; et al. | 2008-06-12 |
Portable storage apparatus and method for freely changing data bus width
Grant 7,363,441 - Yim , et al. April 22, 2 | 2008-04-22 |
Portable Storage Apparatus And Method For Freely Changing Data Bus Width
App 20070288703 - Yim; Myoung-kyoon ; et al. | 2007-12-13 |
Portable storage apparatus and method for freely changing data bus width
Grant 7,234,031 - Yim , et al. June 19, 2 | 2007-06-19 |
Auto focusing apparatus and method
Grant 7,205,543 - Kim , et al. April 17, 2 | 2007-04-17 |
Computer Program Products for Measuring Critical Dimensions of Fine Patterns Using Scanning Electron Microscope Pictures and Secondary Electron Signal Profiles
App 20060231753 - Kang; Min-Sub ; et al. | 2006-10-19 |
Methods and systems for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles
Grant 7,091,485 - Kang , et al. August 15, 2 | 2006-08-15 |
Method and apparatus for measuring dimensions of a pattern on a semiconductor device
App 20050141761 - Lee, Jin-Woo ; et al. | 2005-06-30 |
Apparatus and method for measuring each thickness of a multilayer stacked on a substrate
Grant 6,912,056 - Hyun , et al. June 28, 2 | 2005-06-28 |
Auto focusing apparatus and method
App 20050127293 - Kim, Young-Wan ; et al. | 2005-06-16 |
Methods, systems and computer program products for measuring critical dimensions of fine patterns using scanning electron microscope pictures and secondary electron signal profiles
App 20050127292 - Kang, Min-Sub ; et al. | 2005-06-16 |
Method for cell-free protein complete post-translational modification
App 20050084926 - Choi, Cha Yong ; et al. | 2005-04-21 |
Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image
Grant 6,870,948 - Jun , et al. March 22, 2 | 2005-03-22 |
Apparatus and method for measuring each thickness of a multilayer stacked on a substrate
App 20050041255 - Hyun, Pil-Sik ; et al. | 2005-02-24 |
Method and apparatus for classifying defects of an object
App 20050018182 - Hyun, Pil-Sik ; et al. | 2005-01-27 |
Portable storage apparatus and method for freely changing data bus width
App 20050010710 - Yim, Myoung-kyoon ; et al. | 2005-01-13 |
Method for cell-free protein complete post-translational modification
Grant 6,780,607 - Choi , et al. August 24, 2 | 2004-08-24 |
Method for cell-free protein complete post-translational modification
App 20020106719 - Choi, Cha Yong ; et al. | 2002-08-08 |
Method and apparatus for numerically analyzing grain growth on semiconductor wafer using SEM image
App 20020072133 - Jun, Chung-Sam ; et al. | 2002-06-13 |
Method and circuit for testing memory cells in semiconductor memory device
Grant 5,732,029 - Lee , et al. March 24, 1 | 1998-03-24 |
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