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name:-0.02288293838501
name:-0.016386032104492
name:-0.0084419250488281
Lee; Myungjun Patent Filings

Lee; Myungjun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lee; Myungjun.The latest application filed is for "digital holography microscope (dhm), and inspection method and semiconductor manufacturing method using the dhm".

Company Profile
7.17.22
  • Lee; Myungjun - Seongnam-si KR
  • Lee; Myungjun - San Jose CA
  • Lee; Myungjun - Albany NY
  • Lee; Myungjun - Suwon-si N/A KR
  • Lee; Myungjun - Yongin-si KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Digital Holography Microscope (DHM), and Inspection Method and Semiconductor Manufacturing Method Using the DHM
App 20220276607 - Lee; Myungjun ;   et al.
2022-09-01
Super-resolution holographic microscope
Grant 11,428,947 - Lee , et al. August 30, 2
2022-08-30
Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHM
Grant 11,314,205 - Lee , et al. April 26, 2
2022-04-26
Inspection apparatus and method based on coherent diffraction imaging (CDI)
Grant 11,275,034 - Yun , et al. March 15, 2
2022-03-15
Pupil Ellipsometry Measurement Apparatus And Method And Method Of Fabricating Semiconductor Device Using The Pupil Ellipsometry Measurement Method
App 20220074848 - JUNG; Jaehwang ;   et al.
2022-03-10
Multi-scale Spectral Imaging Apparatuses And Methods, And Methods Of Manufacturing Semiconductor Devices By Using The Imaging Methods
App 20220074867 - Jung; Jaehwang ;   et al.
2022-03-10
Metrology Apparatus And Method Based On Diffraction Using Oblique Illumination And Method Of Manufacturing Semiconductor Device Using The Metrology Method
App 20220005715 - LEE; Myungjun ;   et al.
2022-01-06
Through-focus Image-based Metrology Device, Operation Method Thereof, And Computing Device For Executing The Operation
App 20210396510 - Kim; Kwangsoo ;   et al.
2021-12-23
Holographic Microscope And Manufacturing Method Of Semiconductor Device Using The Same
App 20210200148 - Park; Seungbeom ;   et al.
2021-07-01
Inspection Apparatus And Method Based On Coherent Diffraction Imaging (cdi)
App 20210164919 - Yun; Kyungwon ;   et al.
2021-06-03
Super-resolution Holographic Microscope
App 20210080743 - LEE; Myungjun ;   et al.
2021-03-18
Imaging Ellipsometry (ie)-based Inspection Method And Method Of Fabricating Semiconductor Device By Using Ie-based Inspection Method
App 20210028035 - Lee; Myungjun ;   et al.
2021-01-28
Metrology using overlay and yield critical patterns
Grant 10,685,165 - Kandel , et al.
2020-06-16
Process compatibility improvement by fill factor modulation
Grant 10,579,768 - Levinski , et al.
2020-03-03
Digital Holography Microscope (DHM), and Inspection Method and Semiconductor Manufacturing Method Using the DHM
App 20190369557 - Lee; Myungjun ;   et al.
2019-12-05
Process-sensitive metrology systems and methods
Grant 10,216,096 - Lee , et al. Feb
2019-02-26
Systems and methods for focus-sensitive metrology targets
Grant 10,209,627 - Lee , et al. Feb
2019-02-19
Systems and methods for fabricating metrology targets with sub-resolution features
Grant 10,095,122 - Lee , et al. October 9, 2
2018-10-09
Systems and Methods for Focus-Sensitive Metrology Targets
App 20180196358 - Lee; Myungjun ;   et al.
2018-07-12
System and method for fabricating metrology targets oriented with an angle rotated with respect to device features
Grant 10,018,919 - Lee , et al. July 10, 2
2018-07-10
Process Compatibility Improvement by Fill Factor Modulation
App 20180157784 - Levinski; Vladimir ;   et al.
2018-06-07
System and Method for Fabricating Metrology Targets Oriented with an Angle Rotated with Respect to Device Features
App 20170343903 - Lee; Myungjun ;   et al.
2017-11-30
Process-Sensitive Metrology Systems and Methods
App 20170045826 - Lee; Myungjun ;   et al.
2017-02-16
Metrology Target Design For Tilted Device Designs
App 20170023358 - Lee; Myungjun ;   et al.
2017-01-26
Metal segments as landing pads and local interconnects in an IC device
Grant 9,466,604 - Woo , et al. October 11, 2
2016-10-11
Metrology Using Overlay And Yield Critical Patterns
App 20160253450 - Kandel; Daniel ;   et al.
2016-09-01
Secondary battery and circuit board assembly suitable for secondary battery
Grant 9,419,268 - Lee , et al. August 16, 2
2016-08-16
Metal Segments As Landing Pads And Local Interconnects In An Ic Device
App 20160141291 - WOO; Youngtag ;   et al.
2016-05-19
Diesel engine piston
Grant 9,121,336 - Lee , et al. September 1, 2
2015-09-01
Lithium rechargeable battery
Grant 9,040,192 - Lee , et al. May 26, 2
2015-05-26
Diesel Engine Piston
App 20130019838 - Lee; Myungjun ;   et al.
2013-01-24
Secondary Battery And Circuit Board Assembly Suitable For Secondary Battery
App 20110123838 - Lee; Seongjoon ;   et al.
2011-05-26
External case for secondary batteries and secondary battery using the external case
Grant 7,833,657 - Kim , et al. November 16, 2
2010-11-16
Lithium Rechargeable Battery
App 20090246620 - Lee; Seongjoon ;   et al.
2009-10-01
External case for secondary batteries and secondary battery using the external case
App 20080166628 - Kim; Heongsin ;   et al.
2008-07-10

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