Lee; Ming-Tung

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lee; Ming-Tung.The latest application filed is for "semiconductor structure and manufacturing method of the same".

Company Profile

0.17.17

Lee; Ming-Tung - Taoyuan County TW
Lee; Ming-Tung - Taoyun County TW
Lee; Ming-Tung - Longtan Shiang N/A TW
Lee; Ming-Tung - Taoyuan TW
Lee; Ming-Tung - Hsinchu TW
Lee; Ming-Tung - Taichung TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of fabricating integrated semiconductor device and structure thereof Grant 9,302,904 - Huang , et al. April 5, 2	2016-04-05
Semiconductor structure and manufacturing method of the same Grant 9,202,862 - Lee , et al. December 1, 2	2015-12-01
Semiconductor Structure And Manufacturing Method Of The Same App 20150263085 - Lee; Ming-Tung ; et al.	2015-09-17
Method Of Fabricating Integrated Semiconductor Device And Structure Thereof App 20150044808 - Huang; Hsueh-I ; et al.	2015-02-12
MOS device and method of manufacturing the same Grant 8,940,609 - Chen , et al. January 27, 2	2015-01-27
Semiconductor device having reduced leakage current at breakdown and method of fabricating thereof Grant 8,928,095 - Chen , et al. January 6, 2	2015-01-06
Method of fabricating integrated semiconductor device with MOS, NPN BJT, LDMOS, pre-amplifier and MEMS unit Grant 8,897,470 - Huang , et al. November 25, 2	2014-11-25
MOS device and method of manufacturing the same App 20140302654 - Chen; Chien-Chung ; et al.	2014-10-09
Semiconductor Composite Layer Structure And Semiconductor Packaging Structure Having The Same Thereof App 20140264855 - Lee; Ming-Tung ; et al.	2014-09-18
Semiconductor Device Having Reduced Leakage Current At Breakdown And Method Of Fabricating Thereof App 20140264599 - Chen; Chien-Chung ; et al.	2014-09-18
MOS device and method of manufacturing the same Grant 8,829,615 - Chen , et al. September 9, 2	2014-09-09
Structure of NPN-BJT for improving punch through between collector and emitter Grant 8,581,339 - Chang , et al. November 12, 2	2013-11-12
Schottky diode with enhanced breakdown voltage App 20130285136 - LU; Chin-Hsien ; et al.	2013-10-31
Mos Device And Method Of Manufacturing The Same App 20130056825 - Chen; Chien-Chung ; et al.	2013-03-07
Novel Structure Of Npn-bjt For Improving Punch Through Between Collector And Emitter App 20130037914 - Chang; Chin-Wei ; et al.	2013-02-14
Semiconductor bio-sensors and methods of manufacturing the same Grant 8,357,547 - Lee , et al. January 22, 2	2013-01-22
Semiconductor devices and methods of manufacturing the same Grant 8,354,716 - Huang , et al. January 15, 2	2013-01-15
Semiconductor Bio-sensors And Methods Of Manufacturing The Same App 20120270350 - Lee; Ming-Tung ; et al.	2012-10-25
Semiconductor bio-sensors and methods of manufacturing the same Grant 8,227,877 - Lee , et al. July 24, 2	2012-07-24
Ldmos Having Single-strip Source Contact And Method For Manufacturing Same App 20120037989 - Huang; Hsueh-I ; et al.	2012-02-16
Semiconductor Bio-sensors And Methods Of Manufacturing The Same App 20120012900 - LEE; Ming-Tung ; et al.	2012-01-19
Semiconductor Devices And Methods Of Manufacturing The Same App 20120001260 - Huang; Hsueh I. ; et al.	2012-01-05
Method Of Fabricating Integrated Semiconductor Device And Structure Thereof App 20110026742 - Huang; Hsueh-I ; et al.	2011-02-03
Method for fabricating a non-volatile memory and metal interconnect process Grant 6,881,619 - Lee , et al. April 19, 2	2005-04-19
Hermetically sealed electrical switch assembly Grant 6,762,662 - Lee , et al. July 13, 2	2004-07-13
Hermetically sealed electrical switch assembly App 20030090352 - Lee, Wen-Fong ; et al.	2003-05-15

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.