LEE; KUEN-JONG

Patent Applications and Registrations

Patent applications and USPTO patent grants for LEE; KUEN-JONG.The latest application filed is for "dynamic secret key security system for test circuit and method of the same".

Company Profile

3.9.9

LEE; KUEN-JONG - TAINAN CITY TW
Lee; Kuen-Jong - Tainan TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Dynamic Secret Key Security System For Test Circuit And Method Of The Same App 20210083868 - LEE; KUEN-JONG ; et al.	2021-03-18
Integrated circuit automatic test system and integrated circuit automatic test method storing test data in scan chains Grant 10,324,129 - Lee , et al.	2019-06-18
Test decompressor and test method thereof Grant 10,324,130 - Lee , et al.	2019-06-18
Test Decompressor And Test Method Thereof App 20180120378 - LEE; KUEN-JONG ; et al.	2018-05-03
Integrated Circuit Automatic Test System And Integrated Circuit Automatic Test Method Storing Test Data In Scan Chains App 20180038911 - LEE; KUEN-JONG ; et al.	2018-02-08
System and method for temperature sensing of three-dimensional integrated circuit Grant 9,857,240 - Chang , et al. January 2, 2	2018-01-02
Defect diagnosis Grant 9,766,286 - Lee , et al. September 19, 2	2017-09-19
Multi-point temperature sensing method for integrated circuit chip and system of the same Grant 9,448,122 - Chang , et al. September 20, 2	2016-09-20
Defect Diagnosis App 20160055631 - Lee; Kuen-Jong ; et al.	2016-02-25
System And Method For Temperature Sensing Of Three-dimensional Integrated Circuit App 20150369764 - CHANG; SOON-JYH ; et al.	2015-12-24
Multi-point Temperature Sensing Method For Integrated Circuit Chip And System Of The Same App 20140341258 - CHANG; SOON-JYH ; et al.	2014-11-20
Debugging control system using inside core event as trigger condition and method of the same Grant 8,892,973 - Lee , et al. November 18, 2	2014-11-18
Debugging Control System Using Inside Core Event As Trigger Condition And Method Of The Same App 20140075255 - LEE; KUEN-JONG ; et al.	2014-03-13
Multi-project system-on-chip and its method Grant 7,571,414 - Huang , et al. August 4, 2	2009-08-04
Multi-project system-on-chip and its method App 20070294658 - Huang; Chun-Ming ; et al.	2007-12-20
Test method and architecture for circuits having inputs Grant 7,159,161 - Lee , et al. January 2, 2	2007-01-02
Test method and architecture for circuits having inputs App 20040153921 - Lee, Kuen-Jong ; et al.	2004-08-05
Built-in self test for multiple memories in a chip Grant 6,360,342 - Lee , et al. March 19, 2	2002-03-19

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