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name:-0.0090539455413818
name:-0.009382963180542
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Lee; Kuei-Pin Patent Filings

Lee; Kuei-Pin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lee; Kuei-Pin.The latest application filed is for "device and method for reducing contact resistance of a metal".

Company Profile
2.8.8
  • Lee; Kuei-Pin - New Taipei TW
  • LEE; Kuei-Pin - New Taipei City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Device and method for reducing contact resistance of a metal
Grant 11,177,168 - Lee , et al. November 16, 2
2021-11-16
Device And Method For Reducing Contact Resistance Of A Metal
App 20190252247 - LEE; Ya-Lien ;   et al.
2019-08-15
Device and method for reducing contact resistance of a metal
Grant 10,276,431 - Lee , et al.
2019-04-30
Device and Method for Reducing Contact Resistance of a Metal
App 20180174898 - Lee; Ya-Lien ;   et al.
2018-06-21
Device and method for reducing contact resistance of a metal
Grant 9,892,963 - Lee , et al. February 13, 2
2018-02-13
Device and Method for Reducing Contact Resistance of a Metal
App 20160111327 - Lee; Ya-Lien ;   et al.
2016-04-21
Device and method for reducing contact resistance of a metal
Grant 9,159,666 - Lee , et al. October 13, 2
2015-10-13
Barrier layer for copper interconnect
Grant 9,064,934 - Lin , et al. June 23, 2
2015-06-23
Barrier Layer for Copper Interconnect
App 20150044867 - Lin; Yu-Hung ;   et al.
2015-02-12
Device and Method for Reducing Contact Resistance of a Metal
App 20140332962 - Lee; Ya-Lien ;   et al.
2014-11-13
Barrier layer for copper interconnect
Grant 8,872,342 - Lin , et al. October 28, 2
2014-10-28
Method for forming seed layer structure
Grant 8,778,801 - Chiang , et al. July 15, 2
2014-07-15
Barrier Layer for Copper Interconnect
App 20140191402 - Lin; Yu-Hung ;   et al.
2014-07-10
Barrier layer for copper interconnect
Grant 8,722,531 - Lin , et al. May 13, 2
2014-05-13
Barrier Layer For Copper Interconnect
App 20140117547 - Lin; Yu-Hung ;   et al.
2014-05-01
Seed Layer Structure and Method
App 20140084470 - Chiang; Chen-Bin ;   et al.
2014-03-27

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