Lee; Ken K.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lee; Ken K..The latest application filed is for "method for characterizing defects on semiconductor wafers".

Company Profile

0.18.10

Lee; Ken K. - Los Altos CA
Lee; Ken K. - Portland OR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defect review system with 2D scanning and a ring detector Grant 7,433,031 - Xu , et al. October 7, 2	2008-10-07
Method for characterizing defects on semiconductor wafers Grant 7,384,806 - Worster , et al. June 10, 2	2008-06-10
Method for Characterizing Defects on Semiconductor Wafers App 20070104357 - Worster; Bruce W. ; et al.	2007-05-10
Method for characterizing defects on semiconductor wafers Grant 7,154,605 - Worster , et al. December 26, 2	2006-12-26
Surface inspection system Grant 7,110,106 - Xu , et al. September 19, 2	2006-09-19
Color scanner display App 20060001914 - Mesmer; Ralph M. ; et al.	2006-01-05
Surface inspection method App 20050105791 - Lee, Ken K. ; et al.	2005-05-19
Surface inspection system App 20050094864 - Xu, James J. ; et al.	2005-05-05
Defect review system and method App 20050094136 - Xu, James J. ; et al.	2005-05-05
Method for characterizing defects on semiconductor wafers Grant 6,661,515 - Worster , et al. December 9, 2	2003-12-09
Multiple phase switching regulator circuits sensing voltages across respective inductances Grant 6,650,096 - Lee November 18, 2	2003-11-18
Method for characterizing defects on semiconductor wafers App 20030203520 - Worster, Bruce W. ; et al.	2003-10-30
Fixture to couple an integrated circuit to a circuit board Grant 6,631,556 - Lee October 14, 2	2003-10-14
Voltage regulation system having an inductive current sensing element Grant 6,614,136 - Lee September 2, 2	2003-09-02
Voltage regulation system having an inductive current sensing element App 20030085692 - Lee, Ken K.	2003-05-08
Voltage regulation system having an inductive current sensing element App 20030085694 - Lee, Ken K.	2003-05-08
Voltage regulator having an inductive current sensing element Grant 6,534,962 - Lee March 18, 2	2003-03-18
Fixture to couple an integrated circuit to a circuit board App 20020178577 - Lee, Ken K.	2002-12-05
Method for characterizing defects on semiconductor wafers App 20020012118 - Worster, Bruce W. ; et al.	2002-01-31
Method for characterizing defects on semiconductor wafers Grant 6,288,782 - Worster , et al. September 11, 2	2001-09-11
Integrated laser imaging and spectral analysis system Grant 6,069,690 - Xu , et al. May 30, 2	2000-05-30
Laser imaging system for inspection and analysis of sub-micron particles Grant 5,963,314 - Worster , et al. October 5, 1	1999-10-05
Method for characterizing defects on semiconductor wafers Grant 5,808,735 - Lee , et al. September 15, 1	1998-09-15
Method and apparatus for automatically focusing a microscope Grant 5,783,814 - Fairley , et al. July 21, 1	1998-07-21
Method and apparatus for automatic focusing of a confocal laser microscope Grant 5,672,861 - Fairley , et al. September 30, 1	1997-09-30
Automated surface acquisition for a confocal microscope Grant 5,594,235 - Lee January 14, 1	1997-01-14
Method and apparatus for performing an automatic focus operation for a microscope Grant 5,483,055 - Thompson , et al. January 9, 1	1996-01-09
Laser imaging system for inspection and analysis of sub-micron particles Grant 5,479,252 - Worster , et al. December 26, 1	1995-12-26

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