Lee; Julie L.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lee; Julie L..The latest application filed is for "computer-based defect root cause and yield impact determination in layered device manufacturing for products and services".
- Lee; Julie L. - Wappingers Falls NY
| Patent | Date |
|---|---|
| Computer-based Defect Root Cause And Yield Impact Determination In Layered Device Manufacturing For Products And Services App 20150204799 - Cipriany; Benjamin R. ; et al. | 2015-07-23 |
| Identifying defects Grant 8,571,299 - Fayaz , et al. October 29, 2 | 2013-10-29 |
| Identifying Defects App 20120050728 - Fayaz; Mohammed F. ; et al. | 2012-03-01 |
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