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Patent applications and USPTO patent grants for Lee; Joong Whan.The latest application filed is for "focused-beam ellipsometer".
Patent | Date |
---|---|
Focused-beam ellipsometer Grant 8,004,677 - Lee , et al. August 23, 2 | 2011-08-23 |
Focused-beam ellipsometer App 20100045985 - Lee; Joong Whan ;   et al. | 2010-02-25 |
Apparatus for measuring characteristics of thin film by means of two-dimensional detector and method of measuring the same Grant 7,286,242 - Kim , et al. October 23, 2 | 2007-10-23 |
Apparatus for measuring thickness profile and refractive index distribution of multiple layers of thin films by means of two-dimensional refrectometry and method of measuring the same App 20040246493 - Kim, Yeong Ryeol ;   et al. | 2004-12-09 |
Method For Manufacturing Phosphor-coated Particles And Method For Forming Cathodoluminescent Screen Using The Same Or Field Emission Display App 20010051269 - YUN, SUN JIN ;   et al. | 2001-12-13 |
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