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Patent applications and USPTO patent grants for Lee; Joong He.The latest application filed is for "drop mass deviation measuring apparatus, drop mass deviation measuring method of the same, pattern forming system using the same, and control method of the pattern forming system using the same".
Patent | Date |
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Drop mass deviation measuring apparatus, drop mass deviation measuring method of the same, pattern forming system using the same, and control method of the pattern forming system using the same Grant 8,170,827 - Kim , et al. May 1, 2 | 2012-05-01 |
Drop mass deviation measuring apparatus, drop mass deviation measuring method of the same, pattern forming system using the same, and control method of the pattern forming system using the same App 20090164169 - Kim; Chong Uck ;   et al. | 2009-06-25 |
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