Lee; Jong Sig
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lee; Jong Sig.The latest application filed is for "in-situ x-ray diffraction analysis apparatus including peltier-type temperature control unit and analyzing method using the same".
- Lee; Jong Sig - Gyeonggi-do KR
| Patent | Date |
|---|---|
| In-situ X-ray Diffraction Analysis Apparatus Including Peltier-type Temperature Control Unit And Analyzing Method Using The Same App 20220140418 - Sung; Yung-Eun ; et al. | 2022-05-05 |
| Analysis apparatus interlocking in-situ x-ray diffraction and potentiostat and analyzing methods using the same Grant 10,876,980 - Sung , et al. December 29, 2 | 2020-12-29 |
| Analysis Apparatus Interlocking In-situ X-ray Diffraction And Potentiostat And Analyzing Methods Using The Same App 20190250112 - SUNG; Yung-Eun ; et al. | 2019-08-15 |
| X-ray diffractometer and method of correcting measurement position thereof App 20050084066 - Kim, Ki-hong ; et al. | 2005-04-21 |
| Micro-diffraction system and method of analyzing sample using the same App 20050041778 - Lee, Jong-sig ; et al. | 2005-02-24 |
| In-situ monitoring system for bonding process and method therefor App 20040228437 - Lee, Jong-sig ; et al. | 2004-11-18 |
| Optical module App 20040228580 - Lee, Jong-sig ; et al. | 2004-11-18 |
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