loadpatents
name:-0.013373851776123
name:-0.014211893081665
name:-0.0012280941009521
Lee; Jin Fuw Patent Filings

Lee; Jin Fuw

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lee; Jin Fuw.The latest application filed is for "physical design system and method".

Company Profile
0.13.11
  • Lee; Jin Fuw - Yorktown Heights NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Physical design system and method
Grant 8,473,885 - Cohn , et al. June 25, 2
2013-06-25
Physical design system and method
Grant 8,219,943 - Cohn , et al. July 10, 2
2012-07-10
Physical Design System And Method
App 20120167029 - Cohn; John M. ;   et al.
2012-06-28
Optimizing integrated circuit chip designs for optical proximity correction
Grant 8,122,387 - Han , et al. February 21, 2
2012-02-21
Layout quality gauge for integrated circuit design
Grant 8,020,120 - Heng , et al. September 13, 2
2011-09-13
Techniques for Pattern Process Tuning and Design Optimization for Maximizing Process-Sensitive Circuit Yields
App 20110173577 - Chuang; Ching-Te K. ;   et al.
2011-07-14
System and method for employing patterning process statistics for ground rules waivers and optimization
Grant 7,962,865 - Heng , et al. June 14, 2
2011-06-14
Method Of Integrated Circuit Chip Fabrication And Program Product Therefor
App 20100318956 - Han; Geng ;   et al.
2010-12-16
CA resistance variability prediction methodology
Grant 7,831,941 - Chidambarrao , et al. November 9, 2
2010-11-09
Iphysical Design System And Method
App 20090204930 - Cohn; John M. ;   et al.
2009-08-13
Ca Resistance Variability Prediction Methodology
App 20090171644 - Chidambarrao; Dureseti ;   et al.
2009-07-02
Physical design system and method
Grant 7,536,664 - Cohn , et al. May 19, 2
2009-05-19
Layout Quality Gauge for Integrated Circuit Design
App 20090089726 - Heng; Fook-Luen ;   et al.
2009-04-02
System And Method For Employing Patterning Process Statistics For Ground Rules Waivers And Optimization
App 20080301624 - Heng; Fook-Luen ;   et al.
2008-12-04
System and method for employing patterning process statistics for ground rules waivers and optimization
Grant 7,448,018 - Heng , et al. November 4, 2
2008-11-04
System and method for employing patterning process statistics for ground rules waivers and optimization
App 20080066047 - Heng; Fook-Luen ;   et al.
2008-03-13
Integrated circuit logic with self compensating shapes
Grant 7,302,671 - Heng , et al. November 27, 2
2007-11-27
Lithographic process window optimization under complex constraints on edge placement
Grant 7,269,817 - Heng , et al. September 11, 2
2007-09-11
Physical design system and method
App 20060036977 - Cohn; John M. ;   et al.
2006-02-16
Integrated circuit logic with self compensating shapes
App 20050189605 - Heng, Fook-Luen ;   et al.
2005-09-01
Lithographic process window optimization under complex constraints on edge placement
App 20050177810 - Heng, Fook-Luen ;   et al.
2005-08-11
Methods and apparatus for performing slew dependent signal bounding for signal timing analysis
Grant 6,430,731 - Lee , et al. August 6, 2
2002-08-06
Clock distribution network with dual wire routing
Grant 6,144,224 - Lee , et al. November 7, 2
2000-11-07

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