| Patent | Date |
|---|
Integrated circuit test method
Grant 10,496,505 - Hsu , et al. De | 2019-12-03 |
Electronic apparatus and control method thereof
Grant 10,416,233 - Kuo , et al. Sept | 2019-09-17 |
Debugging method executed via scan chain for scan test and related circuitry system
Grant 10,234,503 - Kuo , et al. | 2019-03-19 |
Electronic Apparatus And Control Method Thereof
App 20180210029 - KUO; Chun-Yi ; et al. | 2018-07-26 |
Integrated Circuit Test Method
App 20180181477 - HSU; WEN-HSUAN ; et al. | 2018-06-28 |
Voltage And Frequency Scaling Apparatus, System On Chip And Voltage And Frequency Scaling Method
App 20180052506 - KUO; Chun-Yi ; et al. | 2018-02-22 |
Debugging Method Executed Via Scan Chain For Scan Test And Related Circuitry System
App 20170176522 - Kuo; Chun-Yi ; et al. | 2017-06-22 |
Method of integrated circuit scan clock domain allocation and machine readable media thereof
Grant 9,568,553 - Wu , et al. February 14, 2 | 2017-02-14 |
Estimation apparatus and method for estimating clock skew
Grant 9,274,543 - Chen , et al. March 1, 2 | 2016-03-01 |
Clock edge detection device and method
Grant 9,160,322 - Lo , et al. October 13, 2 | 2015-10-13 |
Test system which shares a register in different modes
Grant 8,984,354 - Kuo , et al. March 17, 2 | 2015-03-17 |
Clock edge detection device and method
App 20150022242 - LO; Yu-Cheng ; et al. | 2015-01-22 |
Delay difference detection and adjustment device and method
Grant 8,907,709 - Lo , et al. December 9, 2 | 2014-12-09 |
Element measurement circuit and method thereof
Grant 8,901,917 - Chen , et al. December 2, 2 | 2014-12-02 |
Scan Clock Generator And Related Method Thereof
App 20140129885 - Chen; Ying-Yen ; et al. | 2014-05-08 |
Method Of Integrated Circuit Scan Clock Domain Allocation And Machine Readable Media Thereof
App 20140091812 - Wu; Ming-Chung ; et al. | 2014-04-03 |
Memory apparatus and testing method thereof
Grant 8,572,444 - Lee , et al. October 29, 2 | 2013-10-29 |
Estimation Apparatus And Method For Estimating Clock Skew
App 20130282318 - Chen; Ying-Yen ; et al. | 2013-10-24 |
Memory with self-test function and method for testing the same
Grant 8,479,060 - Kuo , et al. July 2, 2 | 2013-07-02 |
Configurable Process Variation Monitoring Circuit of Die and Monitoring Method Thereof
App 20120326701 - CHEN; YING-YEN ; et al. | 2012-12-27 |
Test System
App 20120304032 - Kuo; Shuo-Fen ; et al. | 2012-11-29 |
Element Measurement Circuit And Method Thereof
App 20120274310 - CHEN; Ying-Yen ; et al. | 2012-11-01 |
Memory with Self-Test Function and Method for Testing the Same
App 20110179323 - Kuo; Shuo-Fen ; et al. | 2011-07-21 |
Microelectronic device and pin arrangement method thereof
Grant 7,949,919 - Wu , et al. May 24, 2 | 2011-05-24 |
Memory Apparatus And Testing Method Thereof
App 20100235695 - Lee; Jih-Nung ; et al. | 2010-09-16 |
Memory Device And Test Method Thereof
App 20090265592 - Wu; Hsiang-Huang ; et al. | 2009-10-22 |
Microelectronic device and pin arrangement method thereof
App 20090106611 - Wu; Hsiang-Huang ; et al. | 2009-04-23 |
Method and system of fault patterns oriented defect diagnosis for memories
App 20040233767 - Wu, Cheng-Wen ; et al. | 2004-11-25 |
| 