Lee; Jeong-Jin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lee; Jeong-Jin.The latest application filed is for "method for operating touch pad and electronic device for supporting same".

Company Profile

6.13.11

Lee; Jeong-Jin - Seoul KR
Lee; Jeong Jin - Hwaseong-si KR
Lee; Jeong-Jin - Seongnam-si KR
Lee; Jeong-Jin - Asan-si KR
Lee; Jeong Jin - Taejon KR
Lee; Jeong Jin - Daejeon KR
Lee; Jeong Jin - Yuseong-ku KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electronic device and operation method therefor Grant 11,016,603 - Kong , et al. May 25, 2	2021-05-25
Method for operating touch pad and electronic device for supporting same Grant 10,795,464 - Lee , et al. October 6, 2	2020-10-06
Touch input processing method and electronic device for supporting the same Grant 10,656,747 - Lee , et al.	2020-05-19
Method For Operating Touch Pad And Electronic Device For Supporting Same App 20190278393 - LEE; Sung Jun ; et al.	2019-09-12
Method for processing user input and electronic device thereof Grant 10,324,562 - Cho , et al.	2019-06-18
Electronic Device And Operation Method Therefor App 20190179487 - KONG; Kyucheol ; et al.	2019-06-13
Alignment mark, method of measuring wafer alignment, and method of manufacturing a semiconductor device using the method of measuring wafer alignment Grant 10,119,811 - Lee , et al. November 6, 2	2018-11-06
Touch Input Processing Method And Electronic Device For Supporting The Same App 20180224993 - LEE; Sung Jun ; et al.	2018-08-09
Solder ball mounter Grant 10,016,833 - Lee , et al. July 10, 2	2018-07-10
Diffraction-based overlay marks and methods of overlay measurement Grant 9,846,359 - Oh , et al. December 19, 2	2017-12-19
Method For Processing User Input And Electronic Device Thereof App 20170357365 - CHO; Youngho ; et al.	2017-12-14
Diffraction-based Overlay Marks And Methods Of Overlay Measurement App 20170357154 - OH; SEUNG HWA ; et al.	2017-12-14
Alignment Mark, Method Of Measuring Wafer Alignment, And Method Of Manufacturing A Semiconductor Device Using The Method Of Measuring Wafer Alignment App 20170261317 - LEE; Seung Yoon ; et al.	2017-09-14
Method Of Controlling Activation Area Of Touch Screen Panel And Electronic Device Using The Same App 20160239148 - Lee; Jeong-Jin ; et al.	2016-08-18
Method of detecting an asymmetric portion of an overlay mark and method of measuring an overlay including the same Grant 9,281,250 - Oh , et al. March 8, 2	2016-03-08
Method Of Detecting An Asymmetric Portion Of An Overlay Mark And Method Of Measuring An Overlay Including The Same App 20150294916 - OH; SEUNG-HWA ; et al.	2015-10-15
Methods Of Testing Pattern Reliability And Semiconductor Devices App 20150294455 - LEE; Jeong-Jin ; et al.	2015-10-15
Semiconductor package with inner leads exposed from an encapsulant Grant 7,629,677 - Youn , et al. December 8, 2	2009-12-08
Stacked Semiconductor Package And Method Of Manufacturing The Same App 20080073772 - YOUN; Sun-Pil ; et al.	2008-03-27
Semiconductor Package App 20080073759 - Youn; Sun-Pil ; et al.	2008-03-27
Multi-tone transceiver system using two steps of DMT-CMFB Grant 6,690,717 - Kim , et al. February 10, 2	2004-02-10
Time-domain equalizer of cascaded filters for VDSL Grant 6,687,291 - Lee , et al. February 3, 2	2004-02-03
Finite impulse response filter for wave-shaping digital quadrature amplitude modulation symbols Grant 6,188,723 - Lee , et al. February 13, 2	2001-02-13
Fixed length packet switching apparatus using multiplexers and demultiplexers Grant 5,732,085 - Kim , et al. March 24, 1	1998-03-24

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