Lee; Hui Jin
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lee; Hui Jin.The latest application filed is for "image analysis method for extracting feature of image and apparatus therefor".
- Lee; Hui Jin - Pohang-si KR
- Lee; Hui Jin - Yongin KR
| Patent | Date |
|---|---|
| Image analysis method for extracting feature of image and apparatus therefor Grant 10,181,086 - Lee , et al. Ja | 2019-01-15 |
| Image Analysis Method For Extracting Feature Of Image And Apparatus Therefor App 20180197032 - LEE; Seung Yong ; et al. | 2018-07-12 |
| Thickness measuring method for organic coating film on metal surface App 20060119867 - Choi; Hee Sung ; et al. | 2006-06-08 |
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