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Patent applications and USPTO patent grants for LEE; Ho-Yeol.The latest application filed is for "method of monitoring semiconductor fabrication process using xps".
Patent | Date |
---|---|
Method Of Monitoring Semiconductor Fabrication Process Using Xps App 20140342477 - LEEM; Choon-Shik ;   et al. | 2014-11-20 |
Probe card Grant 6,909,297 - Ji , et al. June 21, 2 | 2005-06-21 |
Apparatus and method for cleaning probe card contacts App 20050034743 - Kim, Byoung-Joo ;   et al. | 2005-02-17 |
Apparatus and method for cleaning probe card contacts Grant 6,813,804 - Kim , et al. November 9, 2 | 2004-11-09 |
Probe card App 20040140824 - Ji, Joon-Su ;   et al. | 2004-07-22 |
Apparatus and method for cleaning probe card contacts App 20030226578 - Kim, Byoung-Joo ;   et al. | 2003-12-11 |
Tension measurement apparatus for pogo pin App 20020148301 - Lee, Ho-Yeol ;   et al. | 2002-10-17 |
Apparatus for attaching sand papers on dummy wafers App 20020144387 - Lee, Ho-Yeol ;   et al. | 2002-10-10 |
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