Lee; David I-Chun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lee; David I-Chun.The latest application filed is for "system and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors".

Company Profile

9.4.9

Lee; David I-Chun - San Diego CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System And Method For Factory Calibration Or Reduced Calibration Of An Indwelling Sensor Based On Sensitivity Profile And Baseline Model Of Sensors App 20210330219 - Ma; Rui ; et al.	2021-10-28
System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors Grant 11,051,731 - Ma , et al. July 6, 2	2021-07-06
System And Method For Factory Calibration Or Reduced Calibration Of An Indwelling Sensor Based On Sensitivity Profile And Baseline Model Of Sensors App 20200323470 - Ma; Rui ; et al.	2020-10-15
System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors Grant 10,729,364 - Ma , et al.	2020-08-04
Automatic Analyte Sensor Calibration And Error Detection App 20190339221 - Bhavaraju; Naresh C. ; et al.	2019-11-07
Automatic Analyte Sensor Calibration And Error Detection App 20190339223 - Bhavaraju; Naresh C. ; et al.	2019-11-07
Automatic Analyte Sensor Calibration And Error Detection App 20190339224 - Bhavaraju; Naresh C. ; et al.	2019-11-07
Automatic Analyte Sensor Calibration And Error Detection App 20190339222 - Bhavaraju; Naresh C. ; et al.	2019-11-07
System And Method For Factory Calibration Or Reduced Calibration Of An Indwelling Sensor Based On Sensitivity Profile And Baseli App 20190261904 - Ma; Rui ; et al.	2019-08-29
System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors Grant 10,362,975 - Ma , et al.	2019-07-30
System and method for factory calibration or reduced calibration of an indwelling sensor based on sensitivity profile and baseline model of sensors Grant 10,327,687 - Ma , et al.	2019-06-25
System And Method For Factory Calibration Or Reduced Calibration Of An Indwelling Sensor Based On Sensitivity Profile And Baseline Model Of Sensors App 20170188907 - Ma; Rui ; et al.	2017-07-06
System And Method For Factory Calibration Or Reduced Calibration Of An Indwelling Sensor Based On Sensitivity Profile And Baseline Model Of Sensors App 20170188906 - Ma; Rui ; et al.	2017-07-06

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.