loadpatents
name:-0.026365995407104
name:-0.014990091323853
name:-0.0013139247894287
LEE; DAE-YOUP Patent Filings

LEE; DAE-YOUP

Patent Applications and Registrations

Patent applications and USPTO patent grants for LEE; DAE-YOUP.The latest application filed is for "reticle stage for preventing haze contamination and exposure apparatus having the same".

Company Profile
1.15.20
  • LEE; DAE-YOUP - Singapore SG
  • Lee; Dae-youp - Gunpo-si N/A KR
  • Lee; Dae-youp - Gyeonggi-do N/A KR
  • Lee; Dae-youp - Kyungki-do KR
  • Lee; Dae-youp - Gunpo KR
  • Lee; Dae-youp - Kunpo KR
  • Lee, Dae-youp - Kunpo-city KR
  • Lee, Dae-Youp - Gunpo-city KR
  • Lee, Dae-Youp - Kunpo-shi KR
  • Lee; Dae-Youp - Cheonranam KR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Reticle Stage For Preventing Haze Contamination And Exposure Apparatus Having The Same
App 20210208516 - YOO; JIYONG ;   et al.
2021-07-08
Reticle Pod For Preventing Haze Contamination And Reticle Stocker Having The Same
App 20210157227 - YOO; JIYONG ;   et al.
2021-05-27
Method of fabricating metal contact using double patterning technology and device formed thereby
Grant 8,546,258 - Kim , et al. October 1, 2
2013-10-01
Method Of Fabricating Metal Contact Using Double Patterning Technology And Device Formed Thereby
App 20130171821 - Kim; Bong-cheol ;   et al.
2013-07-04
Method of detecting reticle errors
Grant 8,384,876 - Heo , et al. February 26, 2
2013-02-26
Methods of forming patterns for semiconductor devices
Grant 8,361,905 - Kim , et al. January 29, 2
2013-01-29
Photomask used in fabrication of semiconductor device
Grant 8,241,820 - Kim , et al. August 14, 2
2012-08-14
Method of forming semiconductor device patterns
Grant 8,227,354 - Kim , et al. July 24, 2
2012-07-24
Methods of Forming Patterns for Semiconductor Devices
App 20100240221 - Kim; Bong-cheol ;   et al.
2010-09-23
Photomask Used in Fabrication of Semiconductor Device
App 20100178599 - Kim; Bong-Cheol ;   et al.
2010-07-15
Method Of Forming Semiconductor Device Patterns
App 20100173492 - Kim; Bong-cheol ;   et al.
2010-07-08
Method of detecting reticle errors
App 20100149502 - Heo; Jin-seok ;   et al.
2010-06-17
Overlay key, method of forming the overlay key, semiconductor device including the overlay key and method of manufacturing the semiconductor device
App 20070063317 - Kim; Dae-Joung ;   et al.
2007-03-22
Method of manufacturing a non-volatile semiconductor memory device
App 20070004140 - Jang; Dae-Hyun ;   et al.
2007-01-04
Method for manufacturing a semiconductor device
Grant 7,083,899 - Kim , et al. August 1, 2
2006-08-01
Structure provided on an overlay region, overlay mark having the structure, and method of forming the overlay mark
App 20060118974 - Kim; Dae-Joung ;   et al.
2006-06-08
Methods for adjusting light intensity for photolithography and related systems
App 20060003240 - Shim; Woo-Seok ;   et al.
2006-01-05
Method for forming a minute pattern and method for manufacturing a semiconductor device using the same
Grant 6,933,247 - Byun , et al. August 23, 2
2005-08-23
Photoresist composition and method of forming a photoresist pattern with a controlled remnant ratio
Grant 6,841,338 - Lee , et al. January 11, 2
2005-01-11
Method of forming a pattern of a semiconductor device and photomask therefor
Grant 6,818,480 - Lee , et al. November 16, 2
2004-11-16
Method for forming a minute pattern and method for manufacturing a semiconductor device using the same
App 20040185382 - Byun, Sung-Hwan ;   et al.
2004-09-23
Method for manufacturing a semiconductor device
App 20040058280 - Kim, Bong-Cheol ;   et al.
2004-03-25
Method of forming a pattern of a semiconductor device and photomask therefor
App 20040021221 - Lee, Dae-Youp ;   et al.
2004-02-05
Method of forming a pattern using a photoresist without exposing the photoresist and silicidation method incorporating the same
Grant 6,673,706 - Yoo , et al. January 6, 2
2004-01-06
Method of fabricating flash memory device using self-aligned non-exposure pattern formation process
Grant 6,620,690 - Lee , et al. September 16, 2
2003-09-16
Photoresist composition and method of forming a photoresist pattern with a controlled remnant ratio
App 20030049565 - Lee, Dae-youp ;   et al.
2003-03-13
Method of fabricating flash memory device using self-aligned non-exposure pattern formation process
App 20030022439 - Lee, Jae-han ;   et al.
2003-01-30
Method of forming a pattern using a photoresist without exposing the photoresist and silicidation method incorporating the same
App 20020119403 - Yoo, Ji-Yong ;   et al.
2002-08-29
Method of forming fine patterns in semiconductor device
App 20020059557 - Shin, Hye-Soo ;   et al.
2002-05-16
Method of generating a circuit pattern used for fabricating a semiconductor device
App 20020001975 - Lee, Dae-Youp
2002-01-03
Copolymer of sulfur dioxide and nuclear-substituted trialkylgermylstyrene
Grant 5,314,978 - Kim , et al. May 24, 1
1994-05-24

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