loadpatents
Patent applications and USPTO patent grants for Lee; Chu-Chung.The latest application filed is for "coated bonding wire and methods for bonding using same".
Patent | Date |
---|---|
Surface finish for wirebonding Grant 10,325,876 - Mathew , et al. | 2019-06-18 |
Copper ball bond features and structure Grant 9,461,012 - Higgins, III , et al. October 4, 2 | 2016-10-04 |
Electronic component package and method for forming same Grant 9,437,574 - Tran , et al. September 6, 2 | 2016-09-06 |
Aluminum clad copper structure of an electronic component package and a method of making an electronic component package with an aluminum clad copper structure Grant 9,437,459 - Carpenter , et al. September 6, 2 | 2016-09-06 |
Coated bonding wire and methods for bonding using same Grant 9,368,470 - Lee , et al. June 14, 2 | 2016-06-14 |
Coated Bonding Wire And Methods For Bonding Using Same App 20160126208 - LEE; CHU-CHUNG ;   et al. | 2016-05-05 |
Localized alloying for improved bond reliability Grant 9,331,050 - Hess , et al. May 3, 2 | 2016-05-03 |
Integrated circuit package with voltage distributor Grant 9,331,046 - Lee , et al. May 3, 2 | 2016-05-03 |
Structures for reducing corrosion in wire bonds Grant 9,324,675 - Carpenter , et al. April 26, 2 | 2016-04-26 |
Copper ball bond interface structure and formation Grant 9,257,403 - Tran , et al. February 9, 2 | 2016-02-09 |
Surface Finish For Wirebonding App 20150380376 - MATHEW; VARUGHESE ;   et al. | 2015-12-31 |
Aluminum Clad Copper Structure Of An Electronic Component Package App 20150318240 - CARPENTER; BURTON J. ;   et al. | 2015-11-05 |
Structures And Methods For Reducing Corrosion In Wire Bonds App 20150311173 - CARPENTER; BURTON J. ;   et al. | 2015-10-29 |
Systems And Methods For Multiple Ball Bond Structures App 20150303169 - Tran; Tu-Anh N. ;   et al. | 2015-10-22 |
Encapsulant for a semiconductor device Grant 9,093,383 - Chopin , et al. July 28, 2 | 2015-07-28 |
Copper Ball Bond Interface Structure and Formation App 20150145148 - Tran; Tu-Anh N. ;   et al. | 2015-05-28 |
Electronic Component Package And Method For Forming Same App 20150090480 - TRAN; TU-ANH N. ;   et al. | 2015-04-02 |
Copper Ball Bond Features and Structure App 20150084199 - Higgins, III; Leo M. ;   et al. | 2015-03-26 |
Packaged integrated circuit using wire bonds Grant 8,912,667 - Wenzel , et al. December 16, 2 | 2014-12-16 |
Copper ball bond features and structure Grant 8,907,485 - Higgins, III , et al. December 9, 2 | 2014-12-09 |
Integrated Circuit Package With Voltage Distributor App 20140308779 - LEE; Chu-Chung ;   et al. | 2014-10-16 |
Encapsulant for a semiconductor device Grant 8,853,867 - Chopin , et al. October 7, 2 | 2014-10-07 |
Integrated circuit package with voltage distributor Grant 8,791,582 - Lee , et al. July 29, 2 | 2014-07-29 |
Encapsulant For A Semiconductor Device App 20140145339 - CHOPIN; Sheila F. ;   et al. | 2014-05-29 |
Semiconductor Device Structures And Methods For Copper Bond Pads App 20140061910 - LEE; CHU-CHUNG ;   et al. | 2014-03-06 |
Copper Ball Bond Features and Structure App 20140054781 - Higgins, III; Leo M. ;   et al. | 2014-02-27 |
Packaged Integrated Circuit Using Wire Bonds App 20130193589 - WENZEL; ROBERT J. ;   et al. | 2013-08-01 |
Molded semiconductor package having a filler material Grant 8,318,549 - Hess , et al. November 27, 2 | 2012-11-27 |
Localized Alloying For Improved Bond Reliability App 20120153464 - Hess; Kevin J. ;   et al. | 2012-06-21 |
Power lead-on-chip ball grid array package Grant 8,129,226 - Johnston , et al. March 6, 2 | 2012-03-06 |
Integrated Circuit Package With Voltage Distributor App 20120025401 - LEE; CHU-CHUNG ;   et al. | 2012-02-02 |
Localized alloying for improved bond reliability Grant 8,105,933 - Hess , et al. January 31, 2 | 2012-01-31 |
Molded Semiconductor Package Having A Filler Material App 20110101517 - Hess; Kevin J. ;   et al. | 2011-05-05 |
Interconnect for chip level power distribution Grant 7,829,997 - Hess , et al. November 9, 2 | 2010-11-09 |
Power Lead-on-Chip Ball Grid Array Package App 20100270663 - Johnston; James P. ;   et al. | 2010-10-28 |
Package device having crack arrest feature and method of forming Grant 7,821,104 - Lee , et al. October 26, 2 | 2010-10-26 |
Packaged integrated circuit Grant 7,750,465 - Hess , et al. July 6, 2 | 2010-07-06 |
Package Device Having Crack Arrest Feature And Method Of Forming App 20100052106 - LEE; Chu-Chung ;   et al. | 2010-03-04 |
Cap layer for an aluminum copper bond pad Grant 7,656,045 - Lee , et al. February 2, 2 | 2010-02-02 |
Method of packaging semiconductor devices Grant 7,632,715 - Hess , et al. December 15, 2 | 2009-12-15 |
Packaged integrated circuit with enhanced thermal dissipation Grant 7,572,680 - Hess , et al. August 11, 2 | 2009-08-11 |
Interconnect for improved die to substrate electrical coupling Grant 7,550,318 - Hess , et al. June 23, 2 | 2009-06-23 |
Novel interconnect for chip level power distribution App 20080246165 - Hess; Kevin J. ;   et al. | 2008-10-09 |
Packaged Integrated Circuit App 20080203588 - Hess; Kevin J. ;   et al. | 2008-08-28 |
Localized Alloying For Improved Bond Reliability App 20080179745 - Hess; Kevin J. ;   et al. | 2008-07-31 |
Method Of Packaging Semiconductor Devices App 20080164593 - Hess; Kevin J. ;   et al. | 2008-07-10 |
Packaged Integrated Circuit With Enhanced Thermal Dissipation App 20080136016 - Hess; Kevin J. ;   et al. | 2008-06-12 |
Semiconductor die edge reconditioning Grant 7,374,971 - Yuan , et al. May 20, 2 | 2008-05-20 |
Packaged integrated circuit with enhanced thermal dissipation Grant 7,355,289 - Hess , et al. April 8, 2 | 2008-04-08 |
Interconnect for improved die to substrate electrical coupling App 20080038912 - Hess; Kevin J. ;   et al. | 2008-02-14 |
Cap layer for an aluminum copper bond pad App 20070194460 - Lee; Chu-Chung ;   et al. | 2007-08-23 |
Semiconductor package with crossing conductor assembly and method of manufacture Grant 7,256,488 - Zhou , et al. August 14, 2 | 2007-08-14 |
Semiconductor die having a protective periphery region and method for forming App 20070087067 - Yuan; Yuan ;   et al. | 2007-04-19 |
Packaged integrated circuit with enhanced thermal dissipation App 20070023880 - Hess; Kevin J. ;   et al. | 2007-02-01 |
Semiconductor die edge reconditioning App 20060237850 - Yuan; Yuan ;   et al. | 2006-10-26 |
Semiconductor package with crossing conductor assembly and method of manufacture App 20060163716 - Zhou; Yaping ;   et al. | 2006-07-27 |
Semiconductor package with crossing conductor assembly and method of manufacture Grant 7,049,694 - Zhou , et al. May 23, 2 | 2006-05-23 |
Semiconductor package with crossing conductor assembly and method of manufacture App 20060065966 - Zhou; Yaping ;   et al. | 2006-03-30 |
Semiconductor package with crossing conductor assembly and method of manufacture Grant 6,992,377 - Zhou , et al. January 31, 2 | 2006-01-31 |
Semiconductor package with crossing conductor assembly and method of manufacture App 20050189643 - Zhou, Yaping ;   et al. | 2005-09-01 |
Integrated circuit with test pad structure and method of testing Grant 6,937,047 - Tran , et al. August 30, 2 | 2005-08-30 |
Integrated circuit die having a copper contact and method therefor Grant 6,933,614 - Lee , et al. August 23, 2 | 2005-08-23 |
Integrated circuit with test pad structure and method of testing App 20050030055 - Tran, Tu-Anh ;   et al. | 2005-02-10 |
Integrated circuit die having a copper contact and method therefor App 20040195696 - Lee, Chu-Chung ;   et al. | 2004-10-07 |
Ball grid array package having thermoelectric cooler Grant 6,196,002 - Newman , et al. March 6, 2 | 2001-03-06 |
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