Lee; Chii-Chang
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lee; Chii-Chang.The latest application filed is for "multiple line width electromigration test structure and method".
- Lee; Chii-Chang - Singapore SG
- Lee; Chii-Chang - Austin TX
| Patent | Date |
|---|---|
| Multiple line width electromigration test structure and method Grant 8,253,423 - Lee , et al. August 28, 2 | 2012-08-28 |
| Multiple Line Width Electromigration Test Structure and Method App 20090012747 - Lee; Chii-Chang ; et al. | 2009-01-08 |
| Method of manufacturing a semiconductor device with improved control of deposition layer thickness Grant 5,970,383 - Lee October 19, 1 | 1999-10-19 |
| Process for forming a semiconductor device including conductive members Grant 5,593,919 - Lee , et al. January 14, 1 | 1997-01-14 |
| Semiconductor device with improved electromigration resistance and method for making the same Grant 5,506,450 - Lee , et al. April 9, 1 | 1996-04-09 |
| Process for forming a conductive layer for semiconductor devices Grant 5,393,703 - Olowolafe , et al. February 28, 1 | 1995-02-28 |
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