Lee; Chau-Hwang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lee; Chau-Hwang.The latest application filed is for "height measurement by correlating intensity with position of scanning object along optical axis of a structured illumination microscope".

Company Profile

0.6.4

Lee; Chau-Hwang - Hsin-Dian TW
Lee; Chau-Hwang - Hsin-Dian City TW
Lee; Chau-Hwang - Taipei County TW
Lee; Chau-Hwang - Taipei TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Height measurement by correlating intensity with position of scanning object along optical axis of a structured illumination microscope Grant 9,068,823 - Lee , et al. June 30, 2	2015-06-30
Height Measurement By Correlating Intensity With Position Of Scanning Object Along Optical Axis Of A Structured Illumination Microscope App 20140226165 - Lee; Chau-Hwang ; et al.	2014-08-14
Height measurement by correlating intensity with position of scanning object along optical axis of a structured illumination microscope Grant 8,705,043 - Lee , et al. April 22, 2	2014-04-22
Optical sectioning microscopy Grant 8,019,136 - Lee , et al. September 13, 2	2011-09-13
Optical Profilometry App 20110141483 - Lee; Chau-Hwang ; et al.	2011-06-16
Optical Sectioning Microscopy App 20100135547 - Lee; Chau-Hwang ; et al.	2010-06-03
Method of characterizing transparent thin-films using differential optical sectioning interference microscopy Grant 7,545,510 - Lee , et al. June 9, 2	2009-06-09
Method for characterizing transparent thin-films using differential optical sectioning interference microscopy App 20080266548 - Lee; Chau-Hwang ; et al.	2008-10-30
Differential confocal microscopy Grant 5,804,813 - Wang , et al. September 8, 1	1998-09-08

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