Lee; Byung-Am

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lee; Byung-Am.The latest application filed is for "autofocus method in a scanning electron microscope".

Company Profile

0.6.11

Lee; Byung-Am - Gyeonggi-do KR
Lee; Byung-Am - Suwon-si KR
Lee, Byung-Am - Yeongtong-gu KR
Lee; Byung-am - Suwon KR
Lee, Byung-Am - Suwon-city KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Autofocus method in a scanning electron microscope App 20080237461 - Kim; Jong-Deok ; et al.	2008-10-02
Method and apparatus for classifying repetitive defects on a substrate Grant 7,339,663 - Lim , et al. March 4, 2	2008-03-04
Method of classifying directional defects on an object and apparatus for performing the same App 20080037857 - Lim; Young-Kyu ; et al.	2008-02-14
Wafer alignment apparatus App 20070252993 - Lim; Kyu-Hong ; et al.	2007-11-01
Method for aligning a wafer and apparatus for performing the same Grant 7,235,411 - Lim , et al. June 26, 2	2007-06-26
Auto focusing apparatus and method Grant 7,205,543 - Kim , et al. April 17, 2	2007-04-17
Method of classifying defects and apparatus for performing the method App 20070031982 - Lim; Young-Kyu ; et al.	2007-02-08
Apparatus and method for inspecting patterns on wafers Grant 7,155,366 - Lee , et al. December 26, 2	2006-12-26
Method and apparatus for classifying repetitive defects on a substrate App 20060012782 - Lim; Young-Kyu ; et al.	2006-01-19
Method and apparatus for aligning a substrate, method and apparatus for inspecting a defect on a substrate using the aligning method and apparatus App 20060013092 - Lee; Sung-Man ; et al.	2006-01-19
Method and apparatus for measuring dimensions of a pattern on a semiconductor device App 20050141761 - Lee, Jin-Woo ; et al.	2005-06-30
Auto focusing apparatus and method App 20050127293 - Kim, Young-Wan ; et al.	2005-06-16
Apparatus and method for inspecting patterns on wafers App 20050119844 - Lee, Chang-Hoon ; et al.	2005-06-02
Method for aligning a wafer and apparatus for performing the same App 20050009214 - Lim, Kyu-Hong ; et al.	2005-01-13
Method of and device for detecting micro-scratches Grant 6,528,333 - Jun , et al. March 4, 2	2003-03-04
Method of and device for detecting micro-scratches Grant 6,449,037 - Jun , et al. September 10, 2	2002-09-10
Method of and device for detecting micro-scratches App 20010038448 - Jun, Chung-Sam ; et al.	2001-11-08

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