loadpatents
name:-0.022686958312988
name:-0.018265008926392
name:-0.00045895576477051
Le; Tuan D. Patent Filings

Le; Tuan D.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Le; Tuan D..The latest application filed is for "wafer edge inspection".

Company Profile
0.17.17
  • Le; Tuan D. - Porto Alegre BR
  • Le; Tuan D. - Minneapolis MN
  • Le; Tuan D. - Redmond WA
  • Le; Tuan D - Redmond WA
  • Le; Tuan D. - Bothell WA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Wafer edge inspection illumination system
Grant 9,062,859 - Voges , et al. June 23, 2
2015-06-23
Wafer edge inspection and metrology
Grant 8,818,074 - Pai , et al. August 26, 2
2014-08-26
Wafer Edge Inspection
App 20140063799 - Voges; Christopher ;   et al.
2014-03-06
Method of monitoring fabrication processing including edge bead removal processing
Grant 8,492,178 - Carlson , et al. July 23, 2
2013-07-23
Wafer edge inspection
Grant 8,426,223 - Voges , et al. April 23, 2
2013-04-23
Wafer Edge Inspection And Metrology
App 20130022260 - Pai; Ajay ;   et al.
2013-01-24
Wafer edge inspection and metrology
Grant 8,175,372 - Pai , et al. May 8, 2
2012-05-08
Wafer Edge Inspection
App 20110263049 - Voges; Christopher ;   et al.
2011-10-27
Wafer Edge Inspection And Metrology
App 20110085725 - Pai; Ajay ;   et al.
2011-04-14
Wafer Fabrication Monitoring Systems And Methods, Including Edge Bead Removal Processing
App 20110054659 - Carlson; Alan ;   et al.
2011-03-03
USB device simulator
Grant 7,881,919 - Trumble , et al. February 1, 2
2011-02-01
Wafer edge inspection and metrology
Grant 7,865,010 - Pai , et al. January 4, 2
2011-01-04
Methods to test multimedia devices on computer systems
Grant 7,711,866 - Tierney , et al. May 4, 2
2010-05-04
Wafer Edge Inspection And Metrology
App 20100086197 - Pai; Ajay ;   et al.
2010-04-08
Portable vertical blanking interval signal
Grant 7,683,930 - Tierney , et al. March 23, 2
2010-03-23
Wafer edge inspection and metrology
Grant 7,616,804 - Pai , et al. November 10, 2
2009-11-10
High Resolution Edge Inspection
App 20090196489 - Le; Tuan D.
2009-08-06
Methods to Test Multimedia Devices on Computer Systems
App 20090106419 - Tierney; Percy A. ;   et al.
2009-04-23
Testing a vertical blanking interval signal
Grant 7,479,981 - Tierney , et al. January 20, 2
2009-01-20
Methods to test multimedia devices on computer systems
Grant 7,469,347 - Tierney , et al. December 23, 2
2008-12-23
USB Device Simulator
App 20080249759 - Trumble; Art ;   et al.
2008-10-09
System, method, and computer program product for parsing packetized, multi-program transport stream
Grant 7,349,395 - Liu , et al. March 25, 2
2008-03-25
Wafer edge inspection and metrology
App 20080013822 - Pai; Ajay ;   et al.
2008-01-17
Portable vertical blanking interval signal
App 20060288399 - Tierney; Percy A. ;   et al.
2006-12-21
Testing a vertical blanking interval signal
App 20060284980 - Tierney; Percy A. ;   et al.
2006-12-21
Methods to test multimedia devices on computer systems
App 20060069795 - Tierney; Percy A. ;   et al.
2006-03-30
Systems and methods for monitoring object activity through an external agent using a proxy object
App 20050114738 - Ma, Ji ;   et al.
2005-05-26
Systems and methods for monitoring object activity through an external agent using a proxy object
Grant 6,892,326 - Ma , et al. May 10, 2
2005-05-10
System, method, and computer program product for parsing packetized, multi-program transport stream
App 20040258060 - Liu, Wenhong ;   et al.
2004-12-23
Systems and methods for monitoring object activity through an external agent using a proxy object
App 20030182598 - Ma, Ji ;   et al.
2003-09-25

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