| Patent | Date |
|---|
Two Piece Sensor Assembly And Method Of Use
App 20220153708 - Le; Anthony ; et al. | 2022-05-19 |
Two piece sensor assembly and method of use
Grant 11,261,165 - Le , et al. March 1, 2 | 2022-03-01 |
Hand-held grasping device
Grant 11,172,935 - Wong , et al. November 16, 2 | 2021-11-16 |
Microprojection applicators and methods of use
Grant 11,110,259 - Le , et al. September 7, 2 | 2021-09-07 |
Applicators For Microneedles
App 20210187263 - Trautman; Joseph C. ; et al. | 2021-06-24 |
Applicators for microneedles
Grant 10,946,180 - Trautman , et al. March 16, 2 | 2021-03-16 |
Controlling Temperature And Humidity In A Food Transportation System
App 20200323245 - LE; Anthony ; et al. | 2020-10-15 |
Two Piece Sensor Assembly And Method Of Use
App 20200223805 - Le; Anthony ; et al. | 2020-07-16 |
Microprojection Applicators And Methods Of Use
App 20190184148 - LE; Anthony ; et al. | 2019-06-20 |
Microprojection applicators and methods of use
Grant 10,245,422 - Le , et al. | 2019-04-02 |
Multiple impact microprojection applicators and methods of use
Grant 10,195,409 - Bourne , et al. Fe | 2019-02-05 |
Hearing device
Grant D806,879 - Horbinski , et al. January 2, 2 | 2018-01-02 |
Applicators For Microneedles
App 20170361079 - Trautman; Joseph C. ; et al. | 2017-12-21 |
Sensor Hub Batch Packing
App 20170343392 - Ramasubramanian; Rajasekaran ; et al. | 2017-11-30 |
Hand-held Grasping Device
App 20170224348 - WONG; David ; et al. | 2017-08-10 |
High speed serial peripheral interface memory subsystem
Grant 9,697,872 - Widmer , et al. July 4, 2 | 2017-07-04 |
Applicators for microneedles
Grant 9,687,640 - Trautman , et al. June 27, 2 | 2017-06-27 |
Apparatus and method for programmable read preamble with training pattern
Grant 9,223,726 - Zitlaw , et al. December 29, 2 | 2015-12-29 |
Liquid chromatography-mass spectrometry methods for multiplexed detection and quantitation of free amino acids
Grant 8,945,933 - Le , et al. February 3, 2 | 2015-02-03 |
Multiple Impact Microprojection Applicators And Methods Of Use
App 20140276366 - Bourne; Doug ; et al. | 2014-09-18 |
Microprojection Applicators And Methods Of Use
App 20140276580 - Le; Anthony ; et al. | 2014-09-18 |
Degradable Detergents
App 20140255963 - Le; Anthony | 2014-09-11 |
High Speed Serial Peripheral Interface Memory Subsystem
App 20130151751 - WIDMER; Kevin ; et al. | 2013-06-13 |
High speed memory having a programmable read preamble
Grant 8,417,874 - Zitlaw , et al. April 9, 2 | 2013-04-09 |
Apparatus And Method For Programmable Read Preamble
App 20120066464 - Zitlaw; Clifford Alan ; et al. | 2012-03-15 |
Applicators For Microneedles
App 20110276027 - Trautman; Joseph C. ; et al. | 2011-11-10 |
Programmable Read Preamble
App 20110179215 - Zitlaw; Clifford Alan ; et al. | 2011-07-21 |
SPI auto-boot mode
Grant 7,984,284 - Le , et al. July 19, 2 | 2011-07-19 |
SPI bank addressing scheme for memory densities above 128Mb
Grant 7,979,625 - Le , et al. July 12, 2 | 2011-07-12 |
Liquid Chromatography-Mass Spectrometry Methods For Multiplexed Detection and Quantitation of Free Amino Acids
App 20110085983 - Le; Anthony ; et al. | 2011-04-14 |
Spi Auto-boot Mode
App 20090138694 - Le; Anthony ; et al. | 2009-05-28 |
SPI BANK ADDRESSING SCHEME FOR MEMORY DENSITIES ABOVE 128Mb
App 20090138626 - Le; Anthony ; et al. | 2009-05-28 |
Providing precise timing control within a standardized test instrumentation chassis
Grant 7,437,589 - Le , et al. October 14, 2 | 2008-10-14 |
Circuit card synchronization within a standardized test instrumentation chassis
Grant 7,437,588 - Le , et al. October 14, 2 | 2008-10-14 |
Providing precise timing control between multiple standardized test instrumentation chassis
Grant 7,366,939 - Le , et al. April 29, 2 | 2008-04-29 |
Providing precise timing control between multiple standardized test instrumentation chassis
App 20070168766 - Le; Anthony ; et al. | 2007-07-19 |
Circuit card synchronization within a standardized test instrumentation chassis
App 20070040564 - Le; Anthony ; et al. | 2007-02-22 |
Providing precise timing control within a standardized test instrumentation chassis
App 20070043990 - Le; Anthony ; et al. | 2007-02-22 |
Event processing apparatus and method for high speed event based test system
Grant 7,171,602 - Gomes , et al. January 30, 2 | 2007-01-30 |
Event based IC test system
Grant 7,089,135 - Rajsuman , et al. August 8, 2 | 2006-08-08 |
Event pipeline and summing method and apparatus for event based test system
Grant 7,010,452 - Gomes , et al. March 7, 2 | 2006-03-07 |
Time shift circuit for functional and AC parametric test
Grant 6,934,896 - Larson , et al. August 23, 2 | 2005-08-23 |
Calibration method for system performance validation of automatic test equipment
Grant 6,804,620 - Larson , et al. October 12, 2 | 2004-10-12 |
Calibration Method For System Performance Validation Of Automatic Test Equipment
App 20040186675 - Larson, Douglas ; et al. | 2004-09-23 |
Apparatus for supporting and manipulating a testhead in an automatic test equipment system
Grant 6,771,062 - Markert , et al. August 3, 2 | 2004-08-03 |
Locking apparatus and loadboard assembly
Grant 6,747,447 - Markert , et al. June 8, 2 | 2004-06-08 |
Event pipeline and summing method and apparatus for event based test system
App 20040107058 - Gomes, Glen ; et al. | 2004-06-03 |
Locking apparatus and loadboard assembly
App 20040056675 - Markert, Niels ; et al. | 2004-03-25 |
Test head Hifix for semiconductor device testing apparatus
Grant 6,710,590 - Markert , et al. March 23, 2 | 2004-03-23 |
Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory
Grant 6,668,331 - Gomes , et al. December 23, 2 | 2003-12-23 |
Event processing apparatus and method for high speed event based test system
App 20030229473 - Gomes, Glen ; et al. | 2003-12-11 |
Event based IC test system
App 20030217345 - Rajsuman, Rochit ; et al. | 2003-11-20 |
Time shift circuit for functional and AC parametric test
App 20030126530 - Larson, Doug ; et al. | 2003-07-03 |
Multiple end of test signal for event based test system
Grant 6,404,218 - Le , et al. June 11, 2 | 2002-06-11 |
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