Lazic; Ivan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lazic; Ivan.The latest application filed is for "method of performing tomographic imaging in a charged-particle microscope".

Company Profile

8.9.9

Lazic; Ivan - Eindhoven NL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Discriminative imaging technique in scanning transmission charged particle microscopy Grant 10,699,872 - Bosch , et al.	2020-06-30
Intelligent pre-scan in scanning transmission charged particle microscopy Grant 10,665,419 - Franken , et al.	2020-05-26
Method of performing tomographic imaging in a charged-particle microscope Grant 10,573,488 - Lazic , et al. Feb	2020-02-25
Method Of Performing Tomographic Imaging In A Charged-particle Microscope App 20190348254 - Lazic; Ivan ; et al.	2019-11-14
Imaging technique in scanning transmission charged particle microscopy Grant 10,446,366 - Lazic , et al. Oc	2019-10-15
Intelligent Pre-scan In Scanning Transmission Charged Particle Microscopy App 20190295814 - FRANKEN; Erik Michiel ; et al.	2019-09-26
Discriminative Imaging Technique In Scanning Transmission Charged Particle Microscopy App 20190272974 - BOSCH; Eric Gerardus ; et al.	2019-09-05
Method of performing tomographic imaging in a charged-particle microscope Grant 10,403,469 - Lazic , et al. Sep	2019-09-03
Method of ptychographic imaging Grant 9,959,639 - Bosch , et al. May 1, 2	2018-05-01
Method Of Ptychographic Imaging App 20170024908 - Bosch; Eric Gerardus Theodoor ; et al.	2017-01-26
Method Of Performing Tomographic Imaging In A Charged-particle Microscope App 20160307729 - Lazic; Ivan ; et al.	2016-10-20
Method of examining a sample in a charged-particle microscope Grant 9,312,098 - Lazic , et al. April 12, 2	2016-04-12
Method of investigating the wavefront of a charged-particle beam Grant 9,202,670 - Janssen , et al. December 1, 2	2015-12-01
Method of investigating and correcting aberrations in a charged-particle lens system Grant 9,136,087 - Lazic , et al. September 15, 2	2015-09-15
Method Of Examining A Sample In A Charged-particle Microscope App 20150243474 - Lazic; Ivan ; et al.	2015-08-27
Method Of Investigating The Wavefront Of A Charged-particle Beam App 20150170876 - Janssen; Bart Jozef ; et al.	2015-06-18
Method of Investigating and Correcting Aberrations in a Charged-Particle Lens System App 20140061464 - Lazic; Ivan ; et al.	2014-03-06
Method Of Preparing And Imaging A Lamella In A Particle-optical Apparatus App 20140007307 - Routh, JR.; Brian Roberts ; et al.	2014-01-02

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