Lavallee; Kenneth A.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lavallee; Kenneth A..The latest application filed is for "low-voltage ic test for defect screening".
- Lavallee; Kenneth A. - Colchester VT
| Patent | Date |
|---|---|
| Low-voltage IC test for defect screening Grant 9,285,417 - Poindexter , et al. March 15, 2 | 2016-03-15 |
| Low-voltage Ic Test For Defect Screening App 20140184262 - Poindexter; Daniel J. ; et al. | 2014-07-03 |
| Method and apparatus for providing accurate junction temperature in an integrated circuit App 20040066837 - Armour, Joshua W. ; et al. | 2004-04-08 |
| Method and system for determining common failure modes for integrated circuits App 20020116675 - Gangl, David V. ; et al. | 2002-08-22 |
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