LAURSEN; Thomas

Patent Applications and Registrations

Patent applications and USPTO patent grants for LAURSEN; Thomas.The latest application filed is for "magnesium ion selective membranes".

Company Profile

0.12.12

LAURSEN; Thomas - Bronshoj DK
Laursen; Thomas - Clifton Park NY US
Laursen; Thomas - Phoenix AZ
Laursen; Thomas - New Haven CT
Laursen; Thomas - Tempe AZ
Laursen, Thomas - US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Magnesium Ion Selective Membranes App 20210231601 - NYGAARD; Thomas Pedersen ; et al.	2021-07-29
Lithographic apparatus, reflective member and a method of irradiating the underside of a liquid supply system Grant 9,019,466 - Leenders , et al. April 28, 2	2015-04-28
Method and apparatus for controlled slurry distribution Grant 7,887,396 - Laursen , et al. February 15, 2	2011-02-15
Methods for chemical mechanical planarization and for detecting endpoint of a CMP operation Grant 7,622,052 - Quarantello , et al. November 24, 2	2009-11-24
Lithographic Apparatus, Reflective Member And A Method of Irradiating The Underside Of A Liquid Supply System App 20090027636 - LEENDERS; Martinus Hendrikus Antonius ; et al.	2009-01-29
Method and apparatus for controlling slurry distribution Grant 7,314,402 - Laursen , et al. January 1, 2	2008-01-01
Methods for monitoring a chemical mechanical planarization process of a metal layer using an in-situ eddy current measuring system Grant 7,264,537 - Laursen , et al. September 4, 2	2007-09-04
Method for polishing copper on a workpiece surface App 20060255016 - Svirchevski; Julia ; et al.	2006-11-16
Methods for controlling the pressures of adjustable pressure zones of a work piece carrier during chemical mechanical planarization Grant 7,115,017 - Laursen , et al. October 3, 2	2006-10-03
Method And Apparatus For Controlled Slurry Distribution App 20060151110 - Laursen; Thomas ; et al.	2006-07-13
Multiprobe detection system for chemical-mechanical planarization tool Grant 6,960,115 - Weldon , et al. November 1, 2	2005-11-01
Multizone carrier with process monitoring system for chemical-mechanical planarization tool Grant 6,923,711 - Laursen , et al. August 2, 2	2005-08-02
Detection system for chemical-mechanical planarization tool App 20050026542 - Battal, Tezer ; et al.	2005-02-03
Method for planarizing a work piece App 20050016861 - Laursen, Thomas ; et al.	2005-01-27
Flexible snapshot in endpoint detection Grant 6,821,794 - Laursen , et al. November 23, 2	2004-11-23
Multiprobe detection system for chemical-mechanical planarization tool Grant 6,805,613 - Weldon , et al. October 19, 2	2004-10-19
Multiprobe detection system for chemical-mechanical planarization tool App 20040038624 - Weldon, Matthew ; et al.	2004-02-26
Method for polishing copper on a workpiece surface App 20030134576 - Chadda, Saket ; et al.	2003-07-17
Method and apparatus for controlling slurry distribution App 20030092363 - Laursen, Thomas ; et al.	2003-05-15
Flexible snapshot in endpoint detection App 20030087459 - Laursen, Thomas ; et al.	2003-05-08
Multizone slurry delivery for chemical mechanical polishing tool App 20020173232 - Laursen, Thomas	2002-11-21
Multizone carrier with process monitoring system for chemical-mechanical planarization tool App 20020098777 - Laursen, Thomas ; et al.	2002-07-25
Sacrificial deposit to improve damascene pattern planarization in semiconductor wafers Grant 6,258,711 - Laursen July 10, 2	2001-07-10

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