Lauber; Jan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lauber; Jan.The latest application filed is for "defect size measurement using deep learning methods".

Company Profile

7.9.7

Lauber; Jan - San Francisco CA
Lauber; Jan - Menlo Park CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and system for correlating optical images with scanning electron microscopy images Grant 11,244,442 - Lee , et al. February 8, 2	2022-02-08
Defect Size Measurement Using Deep Learning Methods App 20210364450 - Lauber; Jan ; et al.	2021-11-25
Adaptive care areas for die-die inspection Grant 10,997,710 - Vajaria , et al. May 4, 2	2021-05-04
System and method for characterization of buried defects Grant 10,854,486 - Kirkwood , et al. December 1, 2	2020-12-01
System and Method for Characterization of Buried Defects App 20200090969 - Kirkwood; Jason ; et al.	2020-03-19
Multi-step image alignment method for large offset die-die inspection Grant 10,522,376 - Lauber , et al. Dec	2019-12-31
Self directed metrology and pattern classification Grant 10,483,081 - Park , et al. Nov	2019-11-19
Method and System for Correlating Optical Images with Scanning Electron Microscopy Images App 20190333206 - Lee; Hucheng ; et al.	2019-10-31
Method and system for correlating optical images with scanning electron microscopy images Grant 10,410,338 - Lee , et al. Sept	2019-09-10
Multi-step Image Alignment Method For Large Offset Die-die Inspection App 20190122913 - Lauber; Jan ; et al.	2019-04-25
Adaptive Care Areas For Die-die Inspection App 20190114758 - Vajaria; Himanshu ; et al.	2019-04-18
Self Directed Metrology and Pattern Classification App 20160372303 - Park; Allen ; et al.	2016-12-22
Method and System for Correlating Optical Images with Scanning Electron Microscopy Images App 20150125065 - Lee; Hucheng ; et al.	2015-05-07
Automated inspection using cell-cell subtraction perpendicular to stage motion direction Grant 8,106,355 - Lauber , et al. January 31, 2	2012-01-31
Image quality monitoring for substrate inspection Grant 7,831,083 - Lauber November 9, 2	2010-11-09
In-situ probe for optimizing electron beam inspection and metrology based on surface potential Grant 6,664,546 - McCord , et al. December 16, 2	2003-12-16

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