Larson; Charles Thomas

Patent Applications and Registrations

Patent applications and USPTO patent grants for Larson; Charles Thomas.The latest application filed is for "xps metrology for process control in selective deposition".

Company Profile

6.5.6

Larson; Charles Thomas - Belmont CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
XPS metrology for process control in selective deposition Grant 11,346,795 - Larson , et al. May 31, 2	2022-05-31
Feed-forward of multi-layer and multi-process information using XPS and XRF technologies Grant 11,029,148 - Pois , et al. June 8, 2	2021-06-08
Xps Metrology For Process Control In Selective Deposition App 20210025839 - Larson; Charles Thomas ; et al.	2021-01-28
Feed-forward Of Multi-layer And Multi-process Information Using Xps And Xrf Technologies App 20200370885 - Pois; Heath A. ; et al.	2020-11-26
XPS metrology for process control in selective deposition Grant 10,801,978 - Larson , et al. October 13, 2	2020-10-13
Feed-forward of multi-layer and multi-process information using XPS and XRF technologies Grant 10,648,802 - Pois , et al.	2020-05-12
Feed-forward Of Multi-layer And Multi-process Information Using Xps And Xrf Technologies App 20190360800 - Pois; Heath A. ; et al.	2019-11-28
Xps Metrology For Process Control In Selective Deposition App 20190277783 - Larson; Charles Thomas ; et al.	2019-09-12
Feed-forward Of Multi-layer And Multi-process Information Using Xps And Xrf Technologies App 20190033069 - Pois; Heath A. ; et al.	2019-01-31
Feed-forward of multi-layer and multi-process information using XPS and XRF technologies Grant 10,082,390 - Pois , et al. September 25, 2	2018-09-25
Feed-Forward of Multi-Layer and Multi-Process Information using XPS and XRF Technologies App 20170160081 - Pois; Heath A. ; et al.	2017-06-08

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