Laredo; Gilad

Patent Applications and Registrations

Patent applications and USPTO patent grants for Laredo; Gilad.The latest application filed is for "method of measuring misregistration in the manufacture of topographic semiconductor device wafers".

Company Profile

2.5.10

Laredo; Gilad - Nesher IL
Laredo; Gilad - Haifa IL
Laredo; Gilad - Migdal HaEmek IL
Laredo; Gilad - Milpitas CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method Of Measuring Misregistration In The Manufacture Of Topographic Semiconductor Device Wafers App 20220171296 - Negri; Daria ; et al.	2022-06-02
Measurement modes for overlay Grant 11,346,657 - Manassen , et al. May 31, 2	2022-05-31
Adaptive focusing system for a scanning metrology tool Grant 11,333,616 - Laredo May 17, 2	2022-05-17
Method of measuring misregistration in the manufacture of topographic semiconductor device wafers Grant 11,281,112 - Negri , et al. March 22, 2	2022-03-22
Off-axis illumination overlay measurement using two-diffracted orders imaging Grant 11,281,111 - Shalibo , et al. March 22, 2	2022-03-22
Adaptive Focusing System for a Scanning Metrology Tool App 20220034820 - Laredo; Gilad	2022-02-03
Imaging System For Buried Metrology Targets App 20210372784 - Hill; Andrew V. ; et al.	2021-12-02
Measurement Modes for Overlay App 20210364279 - Manassen; Amnon ; et al.	2021-11-25
Metrology Target For Scanning Metrology App 20210311401 - Hill; Andrew V. ; et al.	2021-10-07
Metrology target for scanning metrology Grant 11,073,768 - Hill , et al. July 27, 2	2021-07-27
Method Of Measuring Misregistration In The Manufacture Of Topographic Semiconductor Device Wafers App 20210200104 - Negri; Daria ; et al.	2021-07-01
System And Method For Measuring Misregistration Of Semiconductor Device Wafers Utilizing Induced Topography App 20210191279 - Negri; Daria ; et al.	2021-06-24
Sensitive Optical Metrology in Scanning and Static Modes App 20210096061 - Hill; Andrew V. ; et al.	2021-04-01
Metrology Target for Scanning Metrology App 20200409271 - Hill; Andrew V. ; et al.	2020-12-31
Off-axis Illumination Overlay Measurement Using Two-diffracted Orders Imaging App 20200132446 - Shalibo; Yoni ; et al.	2020-04-30

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