Laraia; Vincent J.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Laraia; Vincent J..The latest application filed is for "polishing semiconductor wafers using causal models".
- Laraia; Vincent J. - Houlton WI
- Laraia; Vincent J. - Holton WI
| Patent | Date |
|---|---|
| Polishing Semiconductor Wafers Using Causal Models App 20220146991 - Brooks; Brian E. ; et al. | 2022-05-12 |
| Abrasive Elements With Precisely Shaped Features, Abrasive Articles Fabricated Therefrom And Methods Of Making Thereof App 20220134512 - Fritz; Matthew C. ; et al. | 2022-05-05 |
| Abrasive Articles Including Conformable Coatings And Polishing System Therefrom App 20210162559 - Chen; Chi-Fan ; et al. | 2021-06-03 |
| Abrasive Articles Including Conformable Coatings And Polishing System Therefrom App 20200130133 - Chen; Chi-Fan ; et al. | 2020-04-30 |
| Cathodically-protected pad conditioner and method of use Grant 8,496,511 - Laraia , et al. July 30, 2 | 2013-07-30 |
| Cathodically-protected Pad Conditioner And Method Of Use App 20120015589 - Laraia; Vincent J. ; et al. | 2012-01-19 |
| Abrasive articles, CMP monitoring system and method Grant 7,840,305 - Behr , et al. November 23, 2 | 2010-11-23 |
| Abrasive Articles, CMP Monitoring System and Method App 20080004743 - Goers; Brian D. ; et al. | 2008-01-03 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 