Langholz; Nils

Patent Applications and Registrations

Patent applications and USPTO patent grants for Langholz; Nils.The latest application filed is for "microscope and method for generating an image pieced together from a plurality of individual microscope images".

Company Profile

4.11.11

Langholz; Nils - Apolda DE
LANGHOLZ; NILS - Apoida DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for determining the thickness and refractive index of a layer using a shape feature during analysis Grant 11,371,831 - Langholz , et al. June 28, 2	2022-06-28
Method for determining a height position of an object Grant 11,287,629 - Langholz , et al. March 29, 2	2022-03-29
Microscopic imaging method using a correction factor Grant 11,238,575 - Drescher , et al. February 1, 2	2022-02-01
Microscope And Method For Generating An Image Pieced Together From A Plurality Of Individual Microscope Images App 20210364775 - LANGHOLZ; Nils	2021-11-25
Method for Determining the Thickness and Refractive Index of a Layer App 20210293530 - LANGHOLZ; Nils ; et al.	2021-09-23
Method For Determining A Height Position Of An Object App 20210239953 - LANGHOLZ; Nils ; et al.	2021-08-05
Microscope having an objective-exchanging device Grant 10,768,405 - Schacht , et al. Sep	2020-09-08
Confocal microscope with aperture correlation Grant 10,754,136 - Langholz , et al. A	2020-08-25
Method For Determining A Height Position Of An Object App 20200264415 - LANGHOLZ; Nils ; et al.	2020-08-20
Microscopic Imaging Method Using A Correction Factor App 20200005442 - DRESCHER; VIKTOR ; et al.	2020-01-02
Confocal microscope for determination of a layer thickness and microscopy method for determination of a layer thickness Grant 10,436,571 - Vaupel , et al. O	2019-10-08
Light microscope and method for image recording using a light microscope Grant 10,261,300 - Lippert , et al.	2019-04-16
Confocal microscope for determination of a layer thickness and microscopy method for determination of a layer thickness App 20190033054 - Vaupel; Matthias ; et al.	2019-01-31
Confocal Microscope With Aperture Correlation App 20170108682 - LANGHOLZ; Nils ; et al.	2017-04-20
Device and method for microscopy using light with differing physical properties Grant 9,494,782 - Langholz , et al. November 15, 2	2016-11-15
Light microscope and microscopy method for examining a microscopic specimen Grant 9,410,794 - Lippert , et al. August 9, 2	2016-08-09
Light microscope and microscopy method for examining a microscopic specimen App 20150090908 - Lippert; Helmut ; et al.	2015-04-02
Device and method for microscopy App 20150077845 - Langholz; Nils ; et al.	2015-03-19
Light microscope and method for image recording using a light microscope App 20150054937 - Lippert; Helmut ; et al.	2015-02-26
Laser scanning microscope and method for operation thereof Grant 8,879,072 - Langholz , et al. November 4, 2	2014-11-04
Laser Scanning Microscope And Method For Operation Thereof App 20120229815 - LANGHOLZ; NILS ; et al.	2012-09-13

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.