Lane; Lawrence

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lane; Lawrence.The latest application filed is for "optical metrology model optimization for process control".

Company Profile

0.7.7

Lane; Lawrence - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Selection of wavelengths for integrated circuit optical metrology Grant 7,474,993 - Doddi , et al. January 6, 2	2009-01-06
Selecting a hypothetical profile to use in optical metrology Grant 7,394,554 - Vuong , et al. July 1, 2	2008-07-01
Optical metrology model optimization for process control Grant 7,395,132 - Prager , et al. July 1, 2	2008-07-01
Optical metrology model optimization for process control App 20070225851 - Prager; Dan ; et al.	2007-09-27
Selection of wavelengths for integrated circuit optical metrology App 20070198211 - Doddi; Srinivas ; et al.	2007-08-23
Optical metrology model optimization for process control Grant 7,221,989 - Prager , et al. May 22, 2	2007-05-22
Selection of wavelengths for integrated circuit optical metrology Grant 7,216,045 - Doddi , et al. May 8, 2	2007-05-08
Optical metrology model optimization for process control App 20060247816 - Prager; Dan ; et al.	2006-11-02
Optical metrology model optimization for process control Grant 7,065,423 - Prager , et al. June 20, 2	2006-06-20
Optical metrology model optimization for process control App 20060009872 - Prager; Dan ; et al.	2006-01-12
Selecting a hypothetical profile to use in optical metrology App 20050057748 - Vuong, Vi ; et al.	2005-03-17
Selection of wavelengths for integrated circuit optical metrology App 20030225535 - Doddi, Srinivas ; et al.	2003-12-04
Measurement of metal electroplating and seed layer thickness and profile Grant 6,608,686 - Lane , et al. August 19, 2	2003-08-19
Measurement Of Metal Electroplating And Seed Layer Thickness And Profile App 20030151751 - Lane, Lawrence ; et al.	2003-08-14

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