Lamhot; Yuval
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lamhot; Yuval.The latest application filed is for "systems and methods for scatterometric single-wavelength measurement of misregistration and amelioration thereof".
- Lamhot; Yuval - Haifa IL
| Patent | Date |
|---|---|
| Systems and methods for scatterometric single-wavelength measurement of misregistration and amelioration thereof Grant 11,454,894 - Yagil , et al. September 27, 2 | 2022-09-27 |
| Systems And Methods For Scatterometric Single-wavelength Measurement Of Misregistration And Amelioration Thereof App 20220082950 - Yagil; Alon ; et al. | 2022-03-17 |
| Overlay measurement using multiple wavelengths Grant 11,158,548 - Lamhot , et al. October 26, 2 | 2021-10-26 |
| Accuracy Improvements In Optical Metrology App 20210175132 - Bringoltz; Barak ; et al. | 2021-06-10 |
| Overlay Measurement Using Multiple Wavelengths App 20200381312 - Lamhot; Yuval ; et al. | 2020-12-03 |
| Quick adjustment of metrology measurement parameters according to process variation Grant 10,699,969 - Peled , et al. | 2020-06-30 |
| Quick Adjustment Of Metrology Measurement Parameters According To Process Variation App 20190074227 - Peled; Einat ; et al. | 2019-03-07 |
| Accuracy Improvements In Optical Metrology App 20180047646 - Bringoltz; Barak ; et al. | 2018-02-15 |
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