Patent | Date |
---|
Probe accessories, and methods for probing test points using same Grant 7,492,173 - LaMeres , et al. February 17, 2 | 2009-02-17 |
Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket Grant 7,372,284 - Holcombe , et al. May 13, 2 | 2008-05-13 |
Board-to-board electronic interface using hemi-ellipsoidal surface features Grant 7,338,292 - Johnson , et al. March 4, 2 | 2008-03-04 |
Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making same Grant 7,323,892 - LaMeres , et al. January 29, 2 | 2008-01-29 |
Probe Having A Frame To Align Spring Pins Perpendicularly To A Printed Circuit Board, And Method Of Making Same App 20070296425 - LaMeres; Brock J. ;   et al. | 2007-12-27 |
Regenerator probe Grant 7,282,935 - Wood , et al. October 16, 2 | 2007-10-16 |
Method and apparatus for probing at arbitrary locations within an inaccessible array of leads the solder balls or pins actually connecting a VLSI IC package to a substrate or socket App 20070176611 - Holcombe; Brent A. ;   et al. | 2007-08-02 |
Board-to-board electronic interface using hemi-ellipsoidal surface features App 20070173080 - Johnson; Kenneth W. ;   et al. | 2007-07-26 |
Regenerator probe App 20070170936 - Wood; Glenn ;   et al. | 2007-07-26 |
Probe accessories, and methods for probing test point using same App 20070159191 - LaMeres; Brock J. ;   et al. | 2007-07-12 |
Probe retention kit, and system and method for probing a pattern of points on a printed circuit board Grant 7,242,203 - LaMeres , et al. July 10, 2 | 2007-07-10 |
Signal probe and probe assembly Grant 7,242,202 - Groshong , et al. July 10, 2 | 2007-07-10 |
Incorporation of Isolation Resistor(s) into Probes using Probe Tip Spring Pins App 20070115014 - LaMeres; Brock J. ;   et al. | 2007-05-24 |
Incorporation of isolation resistor(s) into probes using probe tip spring pins Grant 7,183,781 - LaMeres , et al. February 27, 2 | 2007-02-27 |
Apparatus, method, and kit for probing a pattern of points on a printed circuit board Grant 7,145,352 - LaMeres , et al. December 5, 2 | 2006-12-05 |
Signal probe and probe assembly App 20060267606 - Groshong; Joseph ;   et al. | 2006-11-30 |
Connectorless electronic interface between rigid and compliant members using hemi-ellipsoidal surface features App 20060249303 - Johnson; Kenneth W. ;   et al. | 2006-11-09 |
Probe assembly with controlled impedance spring pin or resistor tip spring pin contacts Grant 7,116,121 - Holcombe , et al. October 3, 2 | 2006-10-03 |
Probes with perpendicularly disposed spring pins, and methods of making and using same Grant 7,046,020 - LaMeres , et al. May 16, 2 | 2006-05-16 |
Electronic probe extender Grant 7,025,628 - LaMeres , et al. April 11, 2 | 2006-04-11 |
Incorporation of isolation resistor(s) into probes using probe tip spring pins App 20060033514 - LaMeres; Brock J. ;   et al. | 2006-02-16 |
Probe retention kit, and system and method for probing a pattern of points on a printed circuit board App 20060033518 - LaMeres; Brock J. ;   et al. | 2006-02-16 |
Apparatus, method, and kit for probing a pattern of points on a printed circuit board App 20060033513 - LaMeres; Brock J. ;   et al. | 2006-02-16 |
Backside attach probe, components thereof, and methods for making and using same App 20060022692 - LaMeres; Brock J. ;   et al. | 2006-02-02 |
Probes with perpendicularly disposed spring pins, and methods of making and using same App 20050179454 - LaMeres, Brock J. ;   et al. | 2005-08-18 |
Electronic probe extender App 20050037649 - LaMeres, Brock J. ;   et al. | 2005-02-17 |
Alignment/retention device for connector-less probe Grant 6,822,466 - Holcombe , et al. November 23, 2 | 2004-11-23 |
Method For Fabricating Adaptor For Aligning And Electrically Coupling Circuit Devices Having Dissimilar Connectivity Patterns App 20040007762 - LaMeres, Brock J. | 2004-01-15 |