Lakhawat; Rahul
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lakhawat; Rahul.The latest application filed is for "super-resolution defect review image generation through generative adversarial networks".
- Lakhawat; Rahul - Tamil Nadu IN
- Lakhawat; Rahul - Chennai IN
| Patent | Date |
|---|---|
| Super-resolution defect review image generation through generative adversarial networks Grant 10,949,964 - Pandey , et al. March 16, 2 | 2021-03-16 |
| Super-Resolution Defect Review Image Generation Through Generative Adversarial Networks App 20200098101 - Pandey; Anuj ; et al. | 2020-03-26 |
| Sub-pixel alignment of inspection to design Grant 9,996,942 - Bhattacharyya , et al. June 12, 2 | 2018-06-12 |
| Wafer Defect Discovery App 20170076911 - Chen; Hong ; et al. | 2017-03-16 |
| Wafer defect discovery Grant 9,518,934 - Chen , et al. December 13, 2 | 2016-12-13 |
| Sub-Pixel Alignment of Inspection to Design App 20160275672 - Bhattacharyya; Santosh ; et al. | 2016-09-22 |
| Wafer Defect Discovery App 20160123898 - Chen; Hong ; et al. | 2016-05-05 |
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