Lai; Rick
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lai; Rick.The latest application filed is for "rendered database image-to-inspection image optimization for inspection".
- Lai; Rick - Taichung TW
- Lai; Rick - Taichung City TW
| Patent | Date |
|---|---|
| Lithographic plane check for mask processing Grant 9,671,685 - Lin , et al. June 6, 2 | 2017-06-06 |
| Rendered database image-to-inspection image optimization for inspection Grant 8,818,072 - Ong , et al. August 26, 2 | 2014-08-26 |
| Cost-effective method for extreme ultraviolet (EUV) mask production Grant 8,592,102 - Lin , et al. November 26, 2 | 2013-11-26 |
| Rendered Database Image-to-inspection Image Optimization For Inspection App 20120051621 - Ong; Biow-Hiem ; et al. | 2012-03-01 |
| Cost-effective Method For Extreme Ultraviolet (euv) Mask Production App 20110159410 - Lin; Chin-Hsiang ; et al. | 2011-06-30 |
| Lithographic Plane Check For Mask Processing App 20110161893 - LIN; CHIN-HSIANG ; et al. | 2011-06-30 |
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