loadpatents
Patent applications and USPTO patent grants for Lai; Liyang.The latest application filed is for "diagnosis-aware scan chain stitching".
Patent | Date |
---|---|
Test access architecture for stacked memory and logic dies Grant 9,689,918 - Cheng , et al. June 27, 2 | 2017-06-27 |
Test architecture for characterizing interconnects in stacked designs Grant 9,335,376 - Cheng , et al. May 10, 2 | 2016-05-10 |
Two-dimensional scan architecture Grant 9,222,978 - Huang , et al. December 29, 2 | 2015-12-29 |
Detection and diagnosis of scan cell internal defects Grant 9,086,459 - Guo , et al. July 21, 2 | 2015-07-21 |
Diagnosis-aware scan chain stitching Grant 9,015,543 - Huang , et al. April 21, 2 | 2015-04-21 |
Compound hold-time fault diagnosis Grant 8,862,956 - Huang , et al. October 14, 2 | 2014-10-14 |
Diagnosis-Aware Scan Chain Stitching App 20130166976 - Huang; Yu ;   et al. | 2013-06-27 |
Two-Dimensional Scan Architecture App 20120233512 - Huang; Yu ;   et al. | 2012-09-13 |
Compound Hold-Time Fault Diagnosis App 20120210184 - Huang; Yu ;   et al. | 2012-08-16 |
Detection And Diagnosis Of Scan Cell Internal Defects App 20110191643 - Guo; Ruifeng ;   et al. | 2011-08-04 |
Built-in self-test of integrated circuits using selectable weighting of test patterns Grant 7,840,865 - Lai , et al. November 23, 2 | 2010-11-23 |
Built-in self-test of integrated circuits using selectable weighting of test patterns App 20080235544 - Lai; Liyang ;   et al. | 2008-09-25 |
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