Lai; Liyang
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lai; Liyang.The latest application filed is for "diagnosis-aware scan chain stitching".
- Lai; Liyang - Wilsonville OR
| Patent | Date |
|---|---|
| Test access architecture for stacked memory and logic dies Grant 9,689,918 - Cheng , et al. June 27, 2 | 2017-06-27 |
| Test architecture for characterizing interconnects in stacked designs Grant 9,335,376 - Cheng , et al. May 10, 2 | 2016-05-10 |
| Two-dimensional scan architecture Grant 9,222,978 - Huang , et al. December 29, 2 | 2015-12-29 |
| Detection and diagnosis of scan cell internal defects Grant 9,086,459 - Guo , et al. July 21, 2 | 2015-07-21 |
| Diagnosis-aware scan chain stitching Grant 9,015,543 - Huang , et al. April 21, 2 | 2015-04-21 |
| Compound hold-time fault diagnosis Grant 8,862,956 - Huang , et al. October 14, 2 | 2014-10-14 |
| Diagnosis-Aware Scan Chain Stitching App 20130166976 - Huang; Yu ; et al. | 2013-06-27 |
| Two-Dimensional Scan Architecture App 20120233512 - Huang; Yu ; et al. | 2012-09-13 |
| Compound Hold-Time Fault Diagnosis App 20120210184 - Huang; Yu ; et al. | 2012-08-16 |
| Detection And Diagnosis Of Scan Cell Internal Defects App 20110191643 - Guo; Ruifeng ; et al. | 2011-08-04 |
| Built-in self-test of integrated circuits using selectable weighting of test patterns Grant 7,840,865 - Lai , et al. November 23, 2 | 2010-11-23 |
| Built-in self-test of integrated circuits using selectable weighting of test patterns App 20080235544 - Lai; Liyang ; et al. | 2008-09-25 |
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