Lai; Ken Hanh Duc

Patent Applications and Registrations

Patent applications and USPTO patent grants for Lai; Ken Hanh Duc.The latest application filed is for "memory test ecc auto-correction of failing data".

Company Profile

0.5.6

Lai; Ken Hanh Duc - Sunnyvale CA
Lai; Ken Hanh Duc - San Jose CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Testing memory devices with parallel processing operations Grant 9,612,272 - Zhang , et al. April 4, 2	2017-04-04
Tester having an application specific electronics module, and systems and methods that incorporate or use the same Grant 9,557,372 - De La Puente , et al. January 31, 2	2017-01-31
Testing memory devices with distributed processing operations Grant 9,330,792 - Zhang , et al. May 3, 2	2016-05-03
Memory Testing And Failure Data Filtering App 20150255175 - HYDER; Matt ; et al.	2015-09-10
Memory Test Ecc Auto-correction Of Failing Data App 20150255176 - HYDER; Matt ; et al.	2015-09-10
Testing Memory Devices With Distributed Processing Operations App 20150243370 - ZHANG; Xinguo ; et al.	2015-08-27
Testing Memory Devices With Parallel Processing Operations App 20150243369 - ZHANG; Xinguo ; et al.	2015-08-27
Tester Having An Application Specific Electronics Module, And Systems And Methods That Incorporate Or Use The Same App 20140139251 - De La Puente; Edmundo ; et al.	2014-05-22
Memory tester omits programming of addresses in detected bad columns Grant 6,748,562 - Krech, Jr. , et al. June 8, 2	2004-06-08

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