lai i ming
Patent Applications and Registrations
Patent applications and USPTO patent grants for lai i ming.The latest application filed is for "semiconductor device having epitaxial structures".
- - Kaohsiung TV
- Lai; I-Ming - Kaohsiung N/A TV
- Lai; I-Ming - Kaohsiung City TW
| Patent | Date |
|---|---|
| Semiconductor process Grant 08921206 - | 2014-12-30 |
| Semiconductor process Grant 8,921,206 - Yang , et al. December 30, 2 | 2014-12-30 |
| Semiconductor Device Having Epitaxial Structures App 20140191285 - Liao; Chin-I ; et al. | 2014-07-10 |
| Semiconductor device having epitaxial structures Grant 8,716,750 - Liao , et al. May 6, 2 | 2014-05-06 |
| Compound semiconductor epitaxial structure and method for fabricating the same Grant 8,710,632 - Yu , et al. April 29, 2 | 2014-04-29 |
| Compound Semiconductor Epitaxial Structure And Method For Fabricating The Same App 20140070377 - YU; Tien-Wei ; et al. | 2014-03-13 |
| Method for fabricating first and second epitaxial cap layers Grant 8,647,953 - Liao , et al. February 11, 2 | 2014-02-11 |
| Test pattern for measuring semiconductor alloys using X-ray Diffraction Grant 8,519,390 - Liao , et al. August 27, 2 | 2013-08-27 |
| Semiconductor Process App 20130137243 - Yang; Chan-Lon ; et al. | 2013-05-30 |
| Mos Device And Method For Fabricating The Same App 20130126949 - Liao; Chin-I ; et al. | 2013-05-23 |
| Method of fabricating an epitaxial layer Grant 8,445,363 - Lu , et al. May 21, 2 | 2013-05-21 |
| Semiconductor Device Having Epitaxial Structures App 20130026538 - Liao; Chin-I ; et al. | 2013-01-31 |
| Test Pattern For Measuring Semiconductor Alloys Using X-ray Diffraction App 20130026464 - Liao; Chin-I ; et al. | 2013-01-31 |
| Method Of Fabricating An Epitaxial Layer App 20120270382 - Lu; Tsuo-Wen ; et al. | 2012-10-25 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 