Lahav; Oren
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lahav; Oren.The latest application filed is for "system and method for error reduction for metrology measurements".
- Lahav; Oren - Adi IL
- Lahav; Oren - Herzlia IL
- Lahav; Oren - Hafia N/A IL
| Patent | Date |
|---|---|
| System and method for error reduction for metrology measurements Grant 11,353,799 - Volkovich , et al. June 7, 2 | 2022-06-07 |
| Ptychography based system and method Grant 11,347,045 - Cohen , et al. May 31, 2 | 2022-05-31 |
| System and Method for Error Reduction for Metrology Measurements App 20220155693 - Volkovich; Roie ; et al. | 2022-05-19 |
| Ptychography Based System And Method App 20200142175 - COHEN; Oren ; et al. | 2020-05-07 |
| Methods Of Diagnosing And Treating Pancreatic Cancer App 20140080782 - Palmon; Aaron ; et al. | 2014-03-20 |
| Optomechanical MEMS device including a proof mass and an illumination mitigating mechanism Grant 8,581,165 - Ronen , et al. November 12, 2 | 2013-11-12 |
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