Lagarec; Ken Guillaume
Patent Applications and Registrations
Patent applications and USPTO patent grants for Lagarec; Ken Guillaume.The latest application filed is for "microscopy imaging method and system".
- Lagarec; Ken Guillaume - Ottawa CA
- Lagarec; Ken Guillaume - Gatineau N/A CA
| Patent | Date |
|---|---|
| Method for cross-section sample preparation Grant 11,366,074 - Phaneuf , et al. June 21, 2 | 2022-06-21 |
| Microscopy Imaging Method And System App 20210159046 - PHANEUF; Michael William ; et al. | 2021-05-27 |
| Method and system for cross-sectioning a sample with a preset thickness or to a target site Grant 10,886,100 - Phaneuf , et al. January 5, 2 | 2021-01-05 |
| Method For Cross-section Sample Preparation App 20200264115 - PHANEUF; Michael William ; et al. | 2020-08-20 |
| Microscopy Imaging Method And System App 20200176218 - Phaneuf; Michael William ; et al. | 2020-06-04 |
| Microscopy imaging method and system Grant 10,586,680 - Phaneuf , et al. | 2020-03-10 |
| Microscopy Imaging Method And System App 20180053627 - Phaneuf; Michael William ; et al. | 2018-02-22 |
| Microscopy imaging method and system Grant 9,812,290 - Phaneuf , et al. November 7, 2 | 2017-11-07 |
| Microscopy Imaging Method And System App 20170140897 - Phaneuf; Michael William ; et al. | 2017-05-18 |
| Microscopy imaging method and system Grant 9,633,819 - Phaneuf , et al. April 25, 2 | 2017-04-25 |
| Microscopy Imaging Method And System App 20140226003 - Phaneuf; Michael William ; et al. | 2014-08-14 |
| Apparatus and method for surface modification using charged particle beams Grant 8,552,406 - Phaneuf , et al. October 8, 2 | 2013-10-08 |
| Methods for performing circuit edit operations with low landing energy electron beams Grant 8,466,415 - Phaneuf , et al. June 18, 2 | 2013-06-18 |
| Redeposition Technique For Membrane Attachment App 20130001191 - Lagarec; Ken Guillaume ; et al. | 2013-01-03 |
| Method and system for counting secondary particles Grant 8,093,567 - Lagarec , et al. January 10, 2 | 2012-01-10 |
| Methods For Performing Circuit Edit Operations With Low Landing Energy Electron Beams App 20110204263 - Phaneuf; Michael William ; et al. | 2011-08-25 |
| Apparatus And Method For Surface Modification Using Charged Particle Beams App 20110186719 - PHANEUF; Michael William ; et al. | 2011-08-04 |
| System and method for focused ion beam data analysis Grant 7,897,918 - Phaneuf , et al. March 1, 2 | 2011-03-01 |
| Apparatus and method for surface modification using charged particle beams Grant 7,893,397 - Phaneuf , et al. February 22, 2 | 2011-02-22 |
| Method And System For Counting Secondary Particles App 20100084568 - Lagarec; Ken Guillaume ; et al. | 2010-04-08 |
| System and Method for Focused Ion Beam Data Analysis App 20090135240 - Phaneuf; Michael William ; et al. | 2009-05-28 |
| Method and system for identifying events in FIB Grant 7,535,000 - Phaneuf , et al. May 19, 2 | 2009-05-19 |
| Apparatus and Method for Surface Modification Using Charged Particle Beams App 20080302954 - Phaneuf; Michael William ; et al. | 2008-12-11 |
| Method and system for identifying events in FIB App 20080073580 - Phaneuf; Michael William ; et al. | 2008-03-27 |
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