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name:-0.0078089237213135
name:-0.0027430057525635
Kvamme; Damon Patent Filings

Kvamme; Damon

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kvamme; Damon.The latest application filed is for "vapor as a protectant and lifetime extender in optical systems".

Company Profile
2.6.6
  • Kvamme; Damon - Los Gatos CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Vapor As A Protectant And Lifetime Extender In Optical Systems
App 20210041689 - Zare; David Jalil ;   et al.
2021-02-11
EUV In-Situ Linearity Calibration for TDI Image Sensors Using Test Photomasks
App 20200401037 - Huang; Haifeng ;   et al.
2020-12-24
Single wavelength ellipsometry with improved spot size capability
Grant 9,574,992 - Salcin , et al. February 21, 2
2017-02-21
Segmented mirror apparatus for imaging and method of using the same
Grant 9,448,343 - Kvamme , et al. September 20, 2
2016-09-20
Adaptable illuminating apparatus, system, and method for extreme ultra-violet light
Grant 9,046,500 - Kvamme , et al. June 2, 2
2015-06-02
Segmented Mirror Apparatus For Imaging And Method Of Using The Same
App 20140264051 - Kvamme; Damon ;   et al.
2014-09-18
Adaptable Illuminating Apparatus, System, And Method For Extreme Ultra-violet Light
App 20140175308 - Kvamme; Damon ;   et al.
2014-06-26
Beam conditioning to reduce spatial coherence
Grant 7,926,959 - Kvamme , et al. April 19, 2
2011-04-19
Methods for detecting and classifying defects on a reticle
Grant 7,738,093 - Alles , et al. June 15, 2
2010-06-15
Methods For Detecting And Classifying Defects On A Reticle
App 20080304056 - Alles; David ;   et al.
2008-12-11
Optical compensation in high numerical aperture photomask inspection systems for inspecting photomasks through thick pellicles
Grant 6,952,256 - Roncone , et al. October 4, 2
2005-10-04
Optical compensation in high numerical aperture photomask inspection systems for inspecting photomasks through thick pellicles
App 20040042002 - Roncone, Ronald L. ;   et al.
2004-03-04

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