Kurusu; Hitoshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kurusu; Hitoshi.The latest application filed is for "current reuse type field effect transistor amplifier".
- Kurusu; Hitoshi - Tokyo JP
| Patent | Date |
|---|---|
| Semiconductor device and method for manufacturing same Grant 11,088,074 - Maeda , et al. August 10, 2 | 2021-08-10 |
| Current reuse type field effect transistor amplifier Grant 11,012,036 - Kurusu May 18, 2 | 2021-05-18 |
| Current Reuse Type Field Effect Transistor Amplifier App 20200119694 - KURUSU; Hitoshi | 2020-04-16 |
| Semiconductor Device And Method For Manufacturing Same App 20200020632 - MAEDA; Kazuhiro ; et al. | 2020-01-16 |
| Integrated circuit Grant 10,027,282 - Sugitani , et al. July 17, 2 | 2018-07-17 |
| Frequency multiplier Grant 9,882,551 - Kurusu , et al. January 30, 2 | 2018-01-30 |
| Integrated Circuit App 20170310279 - SUGITANI; Takumi ; et al. | 2017-10-26 |
| Frequency Multiplier App 20170149420 - KURUSU; Hitoshi ; et al. | 2017-05-25 |
| Frequency multiplier Grant 9,553,568 - Kurusu , et al. January 24, 2 | 2017-01-24 |
| Frequency Multiplier App 20160241221 - KURUSU; Hitoshi ; et al. | 2016-08-18 |
| Transistor with heat sink joined to only part of one electrode Grant 8,907,454 - Sasaki , et al. December 9, 2 | 2014-12-09 |
| Transistor App 20130264682 - Sasaki; Yoshinobu ; et al. | 2013-10-10 |
| Directional coupler Grant 8,289,102 - Yamamoto , et al. October 16, 2 | 2012-10-16 |
| Directional Coupler App 20110057746 - Yamamoto; Kazuya ; et al. | 2011-03-10 |
| Method for inspecting transmission line characteristic of a semiconductor device using signal reflection measurement Grant 7,622,930 - Notani , et al. November 24, 2 | 2009-11-24 |
| Semiconductor Devices And Methods For Inspecting The Same App 20080246554 - Notani; Yoshihiro ; et al. | 2008-10-09 |
| Calibration Pattern And Calibration Jig App 20070103144 - HOSHI; Hiroyuki ; et al. | 2007-05-10 |
| Circuit property measurement method Grant 7,173,433 - Hoshi , et al. February 6, 2 | 2007-02-06 |
| Property measurement method for high frequency circuit, calibration pattern, and calibration jig App 20050258819 - Hoshi, Hiroyuki ; et al. | 2005-11-24 |
| Semiconductor integrated circuit device and printed wired board for mounting the same Grant 6,624,512 - Kurusu September 23, 2 | 2003-09-23 |
| Semiconductor integrated circuit device and printed wired board for mounting the same App 20030111727 - Kurusu, Hitoshi | 2003-06-19 |
| Field effect transistor with comb electrodes and via holes Grant 6,252,266 - Hoshi , et al. June 26, 2 | 2001-06-26 |
| Power amplifier Grant 5,949,287 - Kurusu , et al. September 7, 1 | 1999-09-07 |
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