Kurosawa; Toshiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kurosawa; Toshiro.The latest application filed is for "semiconductor surface inspection apparatus and method of illumination".
- Kurosawa; Toshiro - Hachioji JP
- Kurosawa; Toshiro - Tokyo JP
- Kurosawa; Toshiro - Saitama JP
- Kurosawa, Toshiro - Saitama-shi Saitama Pref JP
| Patent | Date |
|---|---|
| Appearance inspection apparatus and projection method for projecting image of sample under inspection Grant 7,330,265 - Kurosawa , et al. February 12, 2 | 2008-02-12 |
| Semiconductor Surface Inspection Apparatus and Method of Illumination App 20080024794 - Miyazaki; Yoko ; et al. | 2008-01-31 |
| Appearance inspection apparatus and projection method for projecting image of sample under inspection App 20060007436 - Kurosawa; Toshiro ; et al. | 2006-01-12 |
| Automatic focusing device for an optical appliance Grant 6,825,454 - Czarnetzki , et al. November 30, 2 | 2004-11-30 |
| Automatic focussing device for an optical appliance App 20040129858 - Czarnetzki, Norbert ; et al. | 2004-07-08 |
| Microscope with and automatic focusing device App 20040021936 - Czarnetzki, Norbert ; et al. | 2004-02-05 |
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