| Patent | Date |
|---|
Aluminum Flake Pigment And Method Of Producing Same
App 20210189142 - FUDABA; Tetsuya ; et al. | 2021-06-24 |
Paint Composition And Painted Product Having Coating Formed From The Paint Composition
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Method and apparatus for inspecting integrated circuit pattern
Grant 7,952,074 - Shinada , et al. May 31, 2 | 2011-05-31 |
Method And Apparatus For Inspecting Integrated Circuit Pattern
App 20080302964 - Shinada; Hiroyuki ; et al. | 2008-12-11 |
Method and apparatus for inspecting integrated circuit pattern
Grant 7,417,444 - Shinada , et al. August 26, 2 | 2008-08-26 |
Hydraulic pressure actuator and continuous manual athletic device using the same
Grant 7,299,741 - Hiramatsu , et al. November 27, 2 | 2007-11-27 |
Patterned wafer inspection method and apparatus therefor
Grant 7,242,015 - Shinada , et al. July 10, 2 | 2007-07-10 |
Hydraulic pressure actuator and continuous manual athletic device using the same
App 20060249017 - Hiramatsu; Kazuaki ; et al. | 2006-11-09 |
Method and apparatus for inspecting integrated circuit pattern
Grant 7,026,830 - Shinada , et al. April 11, 2 | 2006-04-11 |
Method and apparatus for inspecting integrated circuit pattern
App 20060043982 - Shinada; Hiroyuki ; et al. | 2006-03-02 |
Patterned wafer inspection method and apparatus therefor
App 20060017014 - Shinada; Hiroyuki ; et al. | 2006-01-26 |
Patterned wafer inspection method and apparatus therefor
Grant 6,979,823 - Shinada , et al. December 27, 2 | 2005-12-27 |
Patterned wafer inspection method and apparatus therefor
App 20040222377 - Shinada, Hiroyuki ; et al. | 2004-11-11 |
Patterned wafer inspection method and apparatus therefor
Grant 6,797,954 - Shinada , et al. September 28, 2 | 2004-09-28 |
Method and apparatus for inspecting integrated circuit pattern
App 20030169060 - Shinada, Hiroyuki ; et al. | 2003-09-11 |
Patterned wafer inspection method and apparatus therefor
App 20030164460 - Shinada, Hiroyuki ; et al. | 2003-09-04 |
Substrate temperature control system and method for controlling temperature of substrate
Grant 6,518,548 - Sugaya , et al. February 11, 2 | 2003-02-11 |
Ultrasonic medical treating device
Grant 6,511,428 - Azuma , et al. January 28, 2 | 2003-01-28 |
Patterned Wafer Inspection Method And Apparatus Therefor
App 20020117635 - SHINADA, HIROYUKI ; et al. | 2002-08-29 |
Substrate temperature control system and method for controlling temperature of substrate
App 20020113056 - Sugaya, Masakazu ; et al. | 2002-08-22 |
Substrate temperature control system and method for controlling temperature of substrate
Grant 6,394,797 - Sugaya , et al. May 28, 2 | 2002-05-28 |
Method and apparatus for inspecting integrated circuit pattern
App 20020027440 - Shinada, Hiroyuki ; et al. | 2002-03-07 |
Method and apparatus for inspecting integrated circuit pattern
Grant 6,172,363 - Shinada , et al. January 9, 2 | 2001-01-09 |
Scanning electron microscope and method for dimension measuring by using the same
Grant 6,114,695 - Todokoro , et al. September 5, 2 | 2000-09-05 |
Electron microscope
Grant 6,051,834 - Kakibayashi , et al. April 18, 2 | 2000-04-18 |
Scanning electron microscope and method for dimension measuring by using the same
Grant 5,969,357 - Todokoro , et al. October 19, 1 | 1999-10-19 |
Electron microscope and electron microscopy method
Grant 5,936,244 - Yajima , et al. August 10, 1 | 1999-08-10 |
Method and apparatus for X-ray analyses
Grant 5,877,498 - Sugimoto , et al. March 2, 1 | 1999-03-02 |
Electron microscope
Grant 5,866,905 - Kakibayashi , et al. February 2, 1 | 1999-02-02 |
Scanning electron microscope and method for dimension measuring by using the same
Grant 5,866,904 - Todokoro , et al. February 2, 1 | 1999-02-02 |
Cathode having a reservoir and method of manufacturing the same
Grant 5,838,096 - Shinada , et al. November 17, 1 | 1998-11-17 |
Charged particle beam apparatus for measuring magnetic field
Grant 5,666,053 - Suzuki , et al. September 9, 1 | 1997-09-09 |
Schottky emission cathode and a method of stabilizing the same
Grant 5,616,926 - Shinada , et al. April 1, 1 | 1997-04-01 |
Scanning electron microscope and method for dimension measuring by using the same
Grant 5,594,245 - Todokoro , et al. January 14, 1 | 1997-01-14 |
Method and apparatus for x-ray analyses
Grant 5,594,246 - Sudo , et al. January 14, 1 | 1997-01-14 |
Microtron electron accelerator
Grant 5,561,697 - Takafuji , et al. October 1, 1 | 1996-10-01 |
Electron microscope
Grant 5,552,602 - Kakibayashi , et al. September 3, 1 | 1996-09-03 |
X-ray computed tomography system
Grant 5,490,193 - Kuroda , et al. February 6, 1 | 1996-02-06 |
Surface analysis method and apparatus for carrying out the same
Grant 5,481,109 - Ninomiya , et al. January 2, 1 | 1996-01-02 |
Instrument and method for 3-dimensional atomic arrangement observation
Grant 5,278,408 - Kakibayashi , et al. January 11, 1 | 1994-01-11 |
Radiotherapy apparatus
Grant 5,267,294 - Kuroda , et al. November 30, 1 | 1993-11-30 |
Method and apparatus of fabricating electric circuit pattern on thick and thin film hybrid multilayer wiring substrate
Grant 5,162,240 - Saitou , et al. November 10, 1 | 1992-11-10 |
Scanning electron microscope and the like apparatus
Grant 4,893,009 - Kuroda January 9, 1 | 1990-01-09 |
Secondary electron detecting apparatus
Grant 4,658,136 - Ohtaka , et al. April 14, 1 | 1987-04-14 |
Apparatus for focus-deflecting a charged particle beam
Grant 4,475,044 - Kuroda , et al. October 2, 1 | 1984-10-02 |
Electron lens equipment
Grant 4,400,622 - Takeuchi , et al. August 23, 1 | 1983-08-23 |
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