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Patent applications and USPTO patent grants for Kuriyama; Yutaka.The latest application filed is for "measuring probe".
Patent | Date |
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Spherical shape measurement method and apparatus for rotating a sphere about first rotation axis and rotating a sphere hold mechanism about second rotation axis orthogonal to first rotation axis Grant 10,444,008 - Hagino , et al. Oc | 2019-10-15 |
Measuring probe Grant 10,415,949 - Koga , et al. Sept | 2019-09-17 |
Measuring probe Grant 10,393,495 - Koga , et al. A | 2019-08-27 |
Coefficient-of-thermal-expansion measurement method of dimension reference gauge, measuring device for coefficient of thermal expansion and reference gauge Grant 10,352,678 - Yokoyama , et al. July 16, 2 | 2019-07-16 |
Measuring Probe App 20170248402 - KOGA; Satoshi ;   et al. | 2017-08-31 |
Measuring Probe App 20170248400 - KOGA; Satoshi ;   et al. | 2017-08-31 |
Coefficient-Of-Thermal-Expansion Measurement Method Of Dimension Reference Gauge, Measuring Device For Coefficient Of Thermal Expansion And Reference Gauge App 20170089683 - YOKOYAMA; Yuichiro ;   et al. | 2017-03-30 |
Spherical-form measuring apparatus Grant 9,297,631 - Hagino , et al. March 29, 2 | 2016-03-29 |
Spherical Shape Measurement Method And Apparatus App 20160018215 - Hagino; Takeshi ;   et al. | 2016-01-21 |
Grazing Incidence Interferometer App 20150226538 - OTAO; Reiya ;   et al. | 2015-08-13 |
Grazing incidence interferometer Grant 8,913,250 - Ootao , et al. December 16, 2 | 2014-12-16 |
Abscissa calibration jig and abscissa calibration method of laser interference measuring apparatus Grant 8,879,068 - Hagino , et al. November 4, 2 | 2014-11-04 |
Spherical-form Measuring Apparatus App 20140130363 - Hagino; Takeshi ;   et al. | 2014-05-15 |
Grazing incidence interferometer Grant 8,441,650 - Kuriyama , et al. May 14, 2 | 2013-05-14 |
Fizeau interferometer and measurement method using Fizeau interferometer Grant 8,379,222 - Hagino , et al. February 19, 2 | 2013-02-19 |
Abscissa Calibration Jig And Abscissa Calibration Method Of Laser Interference Measuring Apparatus App 20130021614 - HAGINO; Takeshi ;   et al. | 2013-01-24 |
Grazing Incidence Interferometer App 20120327425 - OOTAO; Reiya ;   et al. | 2012-12-27 |
Fizeau Interferometer And Measurement Method Using Fizeau Interferometer App 20110134437 - Hagino; Takeshi ;   et al. | 2011-06-09 |
Grazing Incidence Interferometer App 20110032536 - Kuriyama; Yutaka ;   et al. | 2011-02-10 |
Precision surface plate Grant 7,882,891 - Kuriyama February 8, 2 | 2011-02-08 |
Oblique incidence interferometer App 20100027028 - Kuriyama; Yutaka ;   et al. | 2010-02-04 |
Precision Surface Plate App 20060257621 - Kuriyama; Yutaka | 2006-11-16 |
Air refractometer App 20010043334 - Ishikawa, Jun ;   et al. | 2001-11-22 |
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