Kurihara; Daiki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kurihara; Daiki.The latest application filed is for "inspection method and program storage medium storing the method".
- Kurihara; Daiki - Kyoto JP
- Kurihara; Daiki - Kamigyo-ku JP
| Patent | Date |
|---|---|
| Inspection method and program for inspecting electrical characteristics of a semiconductor wafer Grant 8,013,621 - Sano , et al. September 6, 2 | 2011-09-06 |
| Inspection Method And Program Storage Medium Storing The Method App 20090184729 - Sano; Satoshi ; et al. | 2009-07-23 |
| Probing apparatus and positional deviation acquiring method Grant 7,477,064 - Kurihara , et al. January 13, 2 | 2009-01-13 |
| Probing apparatus and positional deviation acquiring method App 20060238905 - Kurihara; Daiki ; et al. | 2006-10-26 |
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