Kurenuma; Tooru

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kurenuma; Tooru.The latest application filed is for "method of control of probe scan and apparatus for controlling probe scan of scanning probe microscope".

Company Profile

0.6.6

Kurenuma; Tooru - Ibaraki JP
Kurenuma; Tooru - Tsuchiura JP
Kurenuma, Tooru - Tsuchiura-Shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe Microscope App 20080236259 - Kurenuma; Tooru ; et al.	2008-10-02
Probe manufacturing method, probe, and scanning probe microscope Grant 7,388,199 - Morimoto , et al. June 17, 2	2008-06-17
Scanning type probe microscope and probe moving control method therefor Grant 7,350,404 - Kurenuma , et al. April 1, 2	2008-04-01
Scanning probe microscope and measurement method using the same Grant 7,333,191 - Murayama , et al. February 19, 2	2008-02-19
Probe replacement method for scanning probe microscope App 20070180889 - Murayama; Ken ; et al.	2007-08-09
Probe manufacturing method, probe, and scanning probe microsope App 20060284084 - Morimoto; Takafumi ; et al.	2006-12-21
Scanning type probe microscope and probe moving control method therefor App 20060284083 - Kurenuma; Tooru ; et al.	2006-12-21
Scanning probe microscope and measurement method using the same App 20050012936 - Murayama, Ken ; et al.	2005-01-20
Remote control system and remote setting system for construction machinery Grant 6,782,644 - Fujishima , et al. August 31, 2	2004-08-31
Remote control system and remote setting system for construction machinery App 20030147727 - Fujishima, Kazuo ; et al.	2003-08-07
Automatically operated shovel Grant 6,317,669 - Kurenuma , et al. November 13, 2	2001-11-13
Profiling control system for given curved surface Grant 4,987,356 - Yamada , et al. January 22, 1	1991-01-22

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